Surface characterization of a semiconductor SiGe/Si heterostructure by contact angle measurements

1996 ◽  
Vol 10 (10) ◽  
pp. 1067-1074 ◽  
Author(s):  
E. Fadda ◽  
P. Warren ◽  
F. Chollet ◽  
M. Berenguer
2004 ◽  
Vol 39 (2) ◽  
pp. 401-412 ◽  
Author(s):  
A. Bismarck ◽  
A. R. Boccaccini ◽  
E. Egia-Ajuriagojeaskoa ◽  
D. Hülsenberg ◽  
T. Leutbecher

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