Convolutional Neural Network Based Clustering and Manifold Learning Method for Diabetic Plantar Pressure Imaging Dataset

2017 ◽  
Vol 7 (3) ◽  
pp. 639-652 ◽  
Author(s):  
Zairan Li ◽  
Nilanjan Dey ◽  
AmiraS. Ashour ◽  
Luying Cao ◽  
Yu Wang ◽  
...  
Keyword(s):  
Neural Network ◽  
Convolutional Neural Network ◽  
Manifold Learning ◽  
Plantar Pressure ◽  
Learning Method ◽  
Pressure Imaging

Classification of Batik Authenticity Using Convolutional Neural Network Algorithm with Transfer Learning Method

2021 ◽  
Author(s):  
Farrel Athaillah Putra ◽  
Dwi Anggun Cahyati Jamil ◽  
Briliantino Abhista Prabandanu ◽  
Suhaili Faruq ◽  
Firsta Adi Pradana ◽  
...  
Keyword(s):  
Neural Network ◽  
Convolutional Neural Network ◽  
Transfer Learning ◽  
Learning Method ◽  
Network Algorithm ◽  
Neural Network Algorithm

Oversampling Based on Data Augmentation in Convolutional Neural Network for Silicon Wafer Defect Classification

2020 ◽  
Author(s):  
Uzma Batool ◽  
Mohd Ibrahim Shapiai ◽  
Nordinah Ismail ◽  
Hilman Fauzi ◽  
Syahrizal Salleh
Keyword(s):  
Neural Network ◽  
Deep Learning ◽  
Convolutional Neural Network ◽  
Silicon Wafer ◽  
Data Augmentation ◽  
Imbalanced Data ◽  
Training Data ◽  
Defect Classification ◽  
Learning Method ◽  
Test Set

Silicon wafer defect data collected from fabrication facilities is intrinsically imbalanced because of the variable frequencies of defect types. Frequently occurring types will have more influence on the classification predictions if a model gets trained on such skewed data. A fair classifier for such imbalanced data requires a mechanism to deal with type imbalance in order to avoid biased results. This study has proposed a convolutional neural network for wafer map defect classification, employing oversampling as an imbalance addressing technique. To have an equal participation of all classes in the classifier’s training, data augmentation has been employed, generating more samples in minor classes. The proposed deep learning method has been evaluated on a real wafer map defect dataset and its classification results on the test set returned a 97.91% accuracy. The results were compared with another deep learning based auto-encoder model demonstrating the proposed method, a potential approach for silicon wafer defect classification that needs to be investigated further for its robustness.

scholarly journals Deep Learning- Based Surveillance System using Face Recognition

2020 ◽  
Vol 32 ◽  
pp. 03011
Author(s):  
Divya Kapil ◽  
Aishwarya Kamtam ◽  
Akhil Kedare ◽  
Smita Bharne
Keyword(s):  
Neural Network ◽  
Image Processing ◽  
Deep Learning ◽  
Face Recognition ◽  
Convolutional Neural Network ◽  
Surveillance System ◽  
Surveillance Systems ◽  
Learning Method ◽  
Security Systems ◽  
The Face

Surveillance systems are used for the monitoring the activities directly or indirectly. Most of the surveillance system uses the face recognition techniques to monitor the activities. This system builds the automated contemporary biometric surveillance system based on deep learning. The application of the system can be used in various ways. The face prints of the persons will be stored inside the database with relevant statistics and does the face recognition. When any unknown face is recognized then alarm will ring so one can alert the security systems and in addition actions will be taken. The system learns changes while detecting faces automatically using deep learning and gain correct accuracy in face recognition. A deep learning method including Convolutional Neural Network (CNN) is having great significance in the area of image processing. This system can be applicable to monitor the activities for the housing society premises.

Sliding mode control with deep learning method for rotor trajectory control of active magnetic bearing system

2018 ◽  
Vol 41 (5) ◽  
pp. 1383-1394 ◽  
Author(s):  
Xuan Yao ◽  
Zhaobo Chen
Keyword(s):  
Neural Network ◽  
Deep Learning ◽  
Sliding Mode Control ◽  
Convolutional Neural Network ◽  
Sliding Mode ◽  
Magnetic Bearing ◽  
Trajectory Control ◽  
Active Magnetic Bearing ◽  
Learning Method ◽  
Mode Control

Active magnetic bearing (AMB) is competent in rotor trajectory control for potential applications such as mechanical processing and spindle attitude control, while the highly nonlinear and coupled dynamic characteristics especially in the condition of rotor large motion are obstacles in controller design. In this paper, a controller of AMB is proposed to achieve rotor 3D trajectory control. First, the dynamic model of the AMB-rotor system containing a nonlinear electromagnetic force model is introduced. Then the DCNN-SMC (deep convolutional neural network - sliding mode control) controller is proposed. Sliding mode control is used to achieve the tracking control with high robustness and responsiveness, and a deep convolutional neural network based on deep learning method is designed to compensate the uncertainties of the system. Finally, simulation of a 5-degree of freedom (DOF) system on various trajectories demonstrates evident control effect of the proposed controller in precision and significant effect of DCNN based on deep learning method in compensation control.

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