scholarly journals Rapid determination of leaf area and plant height by using light curtain arrays in four species with contrasting shoot architecture

Plant Methods ◽  
2014 ◽  
Vol 10 (1) ◽  
pp. 9 ◽  
Author(s):  
Dimitrios Fanourakis ◽  
Christoph Briese ◽  
Johannes FJ Max ◽  
Silke Kleinen ◽  
Alexander Putz ◽  
...  
Keyword(s):  
Leaf Area ◽  
Plant Height ◽  
Rapid Determination ◽  
Shoot Architecture

An Approach for Indirect Determination of Leaf Area Index

2019 ◽  
Vol 62 (3) ◽  
pp. 655-659 ◽  
Author(s):  
Sally D. Logsdon ◽  
Cindy A. Cambardella
Keyword(s):  
Leaf Area Index ◽  
Leaf Area ◽  
Plant Height ◽  
Canopy Cover ◽  
Ground Cover ◽  
Plant Canopy ◽  
Area Index ◽  
Indirect Determination ◽  
Crop Models

Abstract. Leaf area index (LAI) is important in crop models, but determination of LAI can be challenging for crops and mixtures of crops. The purpose of this study was to determine LAI indirectly from ground cover (determined from photographic images) and canopy height using defined relationships based on crop coefficients. Images of plant canopies were obtained to estimate the green cover fraction. An equation was derived to determine LAI from ground cover and plant height, and the technique was tested on different crops. For three of the measurement dates, the data were compared to LAI measurements obtained with a LAI-2200 plant canopy analyzer. The trend was the same for the two LAI procedures, but there was some scatter. The photographic technique was adequate for LAI determination. Keywords: Ground cover, Plant canopy cover, Plant height.

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis
Sign in / Sign up

Export Citation Format

Share Document