On the Validity of the Arrhenius Model in the Accelerated Testing of Semiconductor Device Reliability

2018 ◽  
pp. 151-157
Author(s):  
Marius Bâzu ◽  
Ioan Bacivarof
Keyword(s):  
Semiconductor Device ◽  
Accelerated Testing ◽  
Arrhenius Model ◽  
Device Reliability ◽  
Semiconductor Device Reliability

Improved Semiconductor Device Reliability from Plasma Dicing

2019 ◽  
Author(s):  
R. Barnett ◽  
Janet Hopkins ◽  
Stewart Fulton ◽  
Oliver Ansell ◽  
Samira Kazemi ◽  
...  
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability

Silicon Wafer Orientation Dependence of Metal Oxide Semiconductor Device Reliability

1994 ◽  
Vol 33 (Part 1, No. 1B) ◽  
pp. 500-504 ◽  
Author(s):  
Kou Nakamura ◽  
Kazuyuki Ohmi ◽  
Kazuma Yamamoto ◽  
Koji Makihara ◽  
Tadahiro Ohmi
Keyword(s):  
Metal Oxide ◽  
Silicon Wafer ◽  
Semiconductor Device ◽  
Orientation Dependence ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Device Reliability ◽  
Semiconductor Device Reliability ◽  
Wafer Orientation

Elements of semiconductor-device reliability

1974 ◽  
Vol 62 (2) ◽  
pp. 149-168 ◽  
Author(s):  
C.G. Peattie ◽  
J.D. Adams ◽  
S.L. Carrell ◽  
T.D. George ◽  
M.H. Valek
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability

scholarly journals Behavior of Space Charge in Polyimide and the Influence on Power Semiconductor Device Reliability

2020 ◽  
Author(s):  
Kunihiko Tajiri ◽  
Hirotaka Muto ◽  
Didier Marty-Dessus ◽  
Laurent Berquez ◽  
Gilbert Teyssedre ◽  
...  
Keyword(s):  
Space Charge ◽  
Semiconductor Device ◽  
Power Semiconductor Device ◽  
Power Semiconductor ◽  
Device Reliability ◽  
Semiconductor Device Reliability
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