Fermiological interpretation of FeTe
                    1−x
                    Se
                    x
                    thin crystal by quantum conductance oscillation

The quantum conductance of the electron interferometers composed of the armchair and metallic zigzag single-walled carbon nanotubes (SWNTs) in an axial magnetic field lower than 100 T has been studied by using the tight-binding approximation and Landauer–Buttiker formula. Quantum conductance oscillation as a function of gate voltage due to Fabry–Perot like electron interference was found. The analytical expressions of the rapid and slow conductance oscillation periods for the armchair SWNTs have been derived. It is shown that they depend on the magnetic field, gate voltage, and tube length. For the case of the metallic zigzag SWNTs, except rapid conductance oscillation, slow conductance oscillation was also found, which should not exist without the axial magnetic field.

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Quantum conductance oscillation in linear monatomic silicon chains

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2013.08.029 ◽

2014 ◽

Vol 56 ◽

pp. 96-101 ◽

Cited By ~ 7

Author(s):

Fu-Ti Liu ◽

Yan Cheng ◽

Fu-Bin Yang ◽

Xiang-Rong Chen

Keyword(s):

Quantum Conductance ◽

Conductance Oscillation

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Friedel'S law breakdown and interpretation of stacking fault images in tetrahedral semiconductors

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100126408 ◽

1987 ◽

Vol 45 ◽

pp. 318-319

Author(s):

Rob. W. Glaisher ◽

A.E.C. Spargo

Keyword(s):

Relative Phase ◽

Point Group ◽

Binary Compound ◽

Stacking Fault ◽

Fold Axis ◽

Atom Pair ◽

Tetrahedral Semiconductors ◽

Group Symmetries ◽

Thin Crystal ◽

Phase Differences

Images of <11> oriented crystals with diamond structure (i.e. C,Si,Ge) are dominated by white spot contrast which, depending on thickness and defocus, can correspond to either atom-pair columns or tunnel sites. Olsen and Spence have demonstrated a method for identifying the correspondence which involves the assumed structure of a stacking fault and the preservation of point-group symmetries by correctly aligned and stigmated images. For an intrinsic stacking fault, a two-fold axis lies on a row of atoms (not tunnels) and the contrast (black/white) of the atoms is that of the {111} fringe containing the two-fold axis. The breakdown of Friedel's law renders this technique unsuitable for the related, but non-centrosymmetric binary compound sphalerite materials (e.g. GaAs, InP, CdTe). Under dynamical scattering conditions, Bijvoet related reflections (e.g. (111)/(111)) rapidly acquire relative phase differences deviating markedly from thin-crystal (kinematic) values, which alter the apparent location of the symmetry elements needed to identify the defect.

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Self-Assembly Optical Components

MRS Proceedings ◽

10.1557/proc-771-10.10 ◽

2003 ◽

Vol 771 ◽

Cited By ~ 2

Author(s):

Pavel I. Lazarev ◽

Michael V. Paukshto ◽

Elena N. Sidorenko

Keyword(s):

Optical Properties ◽

Self Assembly ◽

Crystalline State ◽

Liquid Crystalline ◽

Film Deposition ◽

X Ray Diffraction ◽

Optical Components ◽

Crystal Film ◽

Solid Film ◽

Thin Crystal

AbstractWe report a new method of Thin Crystal Film deposition. In the present paper we describe the method of crystallization, structure, and optical properties of Bisbenzimidazo[2,1-a:1',2',b']anthra[2,1,9-def:6,5,10-d'e'f']-diisoquinoline-6,9-dion (mixture with cis-isomer) (abbreviated DBI PTCA) sulfonation product. The Thin Crystal Film has a thickness of 200-1000 nm, with anisotropic optical properties such as refraction and absorption indices. X-ray diffraction data evidences a lyotropic liquid crystalline state in liquid phase and crystalline state in solid film. Anisotropic optical properties of the film make it useful in optical devices, e.g. liquid crystal displays.

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