ACTIVATION ENERGY FOR HOLE INJECTION AND ANALYSIS OF THE SPACE CHARGE LAYER IN ANTHRACENE CRYSTALS

1974 ◽  
Vol 3 (12) ◽  
pp. 1459-1462
Author(s):  
Masahiro Kotani ◽  
Yoko Watanabe ◽  
Tomoko Kato
1992 ◽  
Vol 262 ◽  
Author(s):  
Y. -A. Wu ◽  
G. Roos ◽  
N. M. Johnson ◽  
C. Herring

ABSTRACTThe passivation and reactivation of As donor dopants in n-type Si was studied with both monatomic hydrogen and deuterium. Hydrogenated Schottky diodes were characterized with C-V and DLTS measurements. The reactivation kinetics of the As-H and As-D complexes were studied in the space-charge layer of reverse biased diodes in the temperature range from 60°C to 120°C. These bias-anneals yield dissociation time constants for As-H, from which an averaged activation energy of 1.17±0.1 eV was determined. Although the dissociation of the As-H complex is appreciably slower than that previously measured for P-H, the activation energy is within about 0.05 eV of that determined previously for the P-H complex (1.2 eV). The depth redistribution of the As-H complexes after bias-annealing agrees with the previous conclusion that hydrogen can assume a negative charge state in n-type Si.


2013 ◽  
Vol 06 (04) ◽  
pp. 1330004 ◽  
Author(s):  
RÜDIGER-A. EICHEL ◽  
EMRE ERDEM ◽  
PETER JAKES ◽  
ANDREW OZAROWSKI ◽  
JOHAN VAN TOL ◽  
...  

The defect structure of ZnO nanoparticles is characterized by means of high-field electron paramagnetic resonance (EPR) spectroscopy. Different point and complex defects could be identified, located at the "bulk" or the surface region of the nanoparticles. In particular, by exploiting the enhanced g-value resolution at a Larmor frequency of 406.4 GHz, it could be shown that the resonance commonly observed at g = 1.96 is comprised of several overlapping resonances from different defects. Based on the high-field EPR analysis, the development of a space-charge layer could be monitored that consists of (shallow) donor-type [Formula: see text] defects at the "bulk" and acceptor-type [Formula: see text] and complex [Formula: see text] defects at the surface. Application of a core-shell model allows to determine the thickness of the depletion layer to 1.0 nm for the here studied compounds [J.J. Schneider et al., Chem. Mater.22, 2203 (2010)].


1997 ◽  
Vol 31 (10) ◽  
pp. 1053-1056 ◽  
Author(s):  
T. V. Blank ◽  
Yu. A. Gol’dberg ◽  
O. V. Konstantinov ◽  
O. I. Obolenskii ◽  
E. A. Posse

Author(s):  
Chengdong Wei ◽  
Hongtao Xue ◽  
Zhou Li ◽  
Fenning Zhao ◽  
Fuling Tang

Abstract The morphology and properties of the interface between solid electrolyte and electrode have important impacts on all-solid-state lithium-sulfur batteries’ performance. We used the first-principles calculations to explore the interface between Li2S cathode and β-Li3PS4 (lithium thiophosphate, LPS) solid electrolyte, including lattice structure, mechanical, electrical properties, interface contact type, and charge distribution in real space. It is found that the interface is significantly reconstructed, and the Li atoms at the interface move mainly parallel to the interface plane. The interface density states introduce metallic properties, mainly contributed by the Li-s and S-s, -p orbitals in Li2S and S-p orbitals in LPS. The highest occupied molecular orbitals of the LPS electrolyte are lower than the electrochemical potential (Fermi level) of the Li2S cathode, thus the electrolyte and cathode materials are reasonable and stable in thermodynamics. Interface density of states shows electrons on the interface do not penetrate from Li2S into LPS, and do not leak electrons to cause electron conduct in LPS. Besides, the interface is an n-type Schottky barrier with a barrier value of 1.0 eV. The work-function of the interface indicates that there is a space charge layer by the redistribution of electrons, which is in agreement with the result of interface charge density difference. The electron/hole pairs will be separate, realizing high current charge and discharge capability because of the space charge layer.


2017 ◽  
Vol 19 (5) ◽  
pp. 3869-3883 ◽  
Author(s):  
Jing Yang ◽  
Mostafa Youssef ◽  
Bilge Yildiz

We present a multi-scale model to predict defect redistribution both in interface core and space charge layer across oxide/oxide hetero-interfaces.


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