Development of an Evaluation Method for a Lithium/Electrolyte Interface Based on X-ray Reflectivity and Grazing Incidence X-ray Scattering Measurements

2021 ◽  
Author(s):  
Koji Kimura ◽  
Haruki Yoshikawa ◽  
Kairi Fujii ◽  
Hisao Kiuchi ◽  
Kazuki Yoshii ◽  
...  
Keyword(s):  
Evaluation Method ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Electrolyte Interface ◽  
Scattering Measurements ◽  
Ray Scattering

scholarly journals Radiation damage in polymer films from grazing-incidence X-ray scattering measurements

2016 ◽  
Vol 54 (11) ◽  
pp. 1074-1086 ◽  
Author(s):  
Saeed Ahmadi Vaselabadi ◽  
David Shakarisaz ◽  
Paul Ruchhoeft ◽  
Joseph Strzalka ◽  
Gila E. Stein
Keyword(s):  
Radiation Damage ◽  
Polymer Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Strain Analysis in Thin La1−xCaxMnO3 Films by Grazing Incidence X-ray Scattering

1999 ◽  
Vol 602 ◽  
Author(s):  
M. Petit ◽  
L. J. Martinez-Miranda ◽  
M. Rajeswari ◽  
A. Biswas ◽  
D. J. Kang ◽  
...  
Keyword(s):  
Film Thickness ◽  
Lattice Mismatch ◽  
Compressive Strain ◽  
Strain Analysis ◽  
Grazing Incidence ◽  
Relaxation Processes ◽  
Near Surface ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractWe have performed depth profile analyses of the lattice parameters in epitaxial thin films of La1−xCaxMno3 (LCMO), where x = 0.33 or 0.3, to understand the evolution of strain relaxation processes in these materials. The analyses were done using Grazing Incidence X-ray Scattering (GIXS) on films of different thicnesses on two different substrates, (100) oriented LaAlO3 (LAO), with a lattice mismatch of ∼2% and (110) oriented NGO, with a lattice mismatch of less than 0.1%. Films grown on LAO can exhibit up to three in-plane strained lattice constants, corresponding to a slight orthorhombic distortion of the crystal, as well as near-surface and columnar lattice relaxation. As a function of film thickness, a crossover from a strained film to a mixture of strained and relaxed regions in the film occurs in the range of 700 Å. The structural evolution at this thickness coincides with a change in the resistivity curve near the metalinsulator transition. The in-plane compressive strain has a range of 0.2 – 1.5%, depending on the film thickness for filsm in the range of 400 - 1500 A.

A general model for estimating the ordering of mesoporous film by grazing incidence small angle X-ray scattering

2014 ◽  
Vol 115 (20) ◽  
pp. 204311 ◽  
Author(s):  
Nie Zhao ◽  
Chunming Yang ◽  
Qian Zhang ◽  
Xueming Lu ◽  
Yuzhu Wang ◽  
...  
Keyword(s):  
Small Angle ◽  
General Model ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Mesoporous Film ◽  
Ray Scattering

Grazing incidence small angle x-ray scattering from free-standing nanostructures

1999 ◽  
Vol 86 (12) ◽  
pp. 6763-6769 ◽  
Author(s):  
Markus Rauscher ◽  
Rogerio Paniago ◽  
Hartmut Metzger ◽  
Zoltan Kovats ◽  
Jan Domke ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Free Standing ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Molecular structure of poly(3-alkyl-thiophenes) investigated by calorimetry and grazing incidence X-ray scattering

2012 ◽  
Vol 97 ◽  
pp. 109-118 ◽  
Author(s):  
Jose Abad ◽  
Nieves Espinosa ◽  
Pilar Ferrer ◽  
Rafael García-Valverde ◽  
Carmen Miguel ◽  
...  
Keyword(s):  
Molecular Structure ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Small angle x-ray scattering measurements of lithographic patterns with sidewall roughness from vertical standing waves

2007 ◽  
Vol 90 (19) ◽  
pp. 193122 ◽  
Author(s):  
Chengqing Wang ◽  
Ronald L. Jones ◽  
Eric K. Lin ◽  
Wen-Li Wu ◽  
Jim Leu
Keyword(s):  
Small Angle ◽  
Standing Waves ◽  
Sidewall Roughness ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering
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