Measurement of the focal length of a collimating lens using the Talbot effect and the moiré technique

1991 ◽  
Vol 30 (31) ◽  
pp. 4479 ◽  
Author(s):  
J. C. Bhattacharya ◽  
A. K. Aggarwal
Keyword(s):  
Focal Length ◽  
Talbot Effect ◽  
Collimating Lens

scholarly journals II. On the spectra of some of the fixed stars

1864 ◽  
Vol 13 ◽  
pp. 242-244 ◽  
Keyword(s):  
Focal Length ◽  
Cylindrical Lens ◽  
Narrow Line ◽  
Stellar Spectra ◽  
Flint Glass ◽  
Small Telescope ◽  
Dispersive Power ◽  
Different Parts ◽  
General Method ◽  
Collimating Lens

After a few introductory remarks, the authors describe the apparatu which they employ, and their general method of observing the spectra the fixed stars and planets. The spectroscope contrived for these inqu ries was attached to the eye end of a refracting telescope of 10 feet foe length, with an 8-incli achromatic object-glass, the whole mounted equa torially and carried by a clock-movement. In the construction of th spectroscope, a plano-convex cylindrical lens, of 14 inches focal length, wa employed to convert the image of the star into a narrow line of light which was made to fall upon a very fine slit, behind which was placed an achromatic collimating lens. The dispersing portion of the arrangement consisted of two dense flint-glass prisms; and the spectrum was viewe through a small achromatic telescope with a magnifying power of between 5 and 6 diameters. Angular measures of the different parts of the spectrum were obtained by means of a micrometric screw, by which the position of the small telescope was regulated. A reflecting prism was placed over one half of the slit of the spectroscope, and by means of a mirror, suitably adjusted, the spectra of comparison were viewed simultaneously with the stellar spectra. This light was usually obtained from the in­duction spark taken between electrodes of different metals. The dispersive power of the apparatus was sufficient to enable the observer to see the line Ni of Kirchhoff between the two solar lines D ; and the three constituents of the magnesium group at b are divided still more evidently*. Minute details of the methods adopted for testing the exact coincidence of the corresponding metallic lines with those of the solar and lunar spectrum, are given, and the authors then proceed to give the results of their obser­vations.

Focal Length Measuring Technique Using The Talbot Effect

1987 ◽  
Author(s):  
P. Andres ◽  
J. Ojeda-Castaneda ◽  
J. C. Barreiro
Keyword(s):  
Focal Length ◽  
Measuring Technique ◽  
Talbot Effect

Research on focal length determination technique of laser test system based on Talbot effect

2009 ◽  
Author(s):  
Ling-ling Wu ◽  
Li Zheng ◽  
Guo-jun Wu ◽  
Yu-ping Cang ◽  
Liang-yi Chen
Keyword(s):  
Focal Length ◽  
Test System ◽  
Talbot Effect ◽  
Length Determination

Resolution Attainable With the Present Day STEM

1973 ◽  
Vol 31 ◽  
pp. 230-231 ◽  
Author(s):  
J. S. Wall ◽  
J. P. Langmore ◽  
H. Isaacson ◽  
A. V. Crewe
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Incident Beam ◽  
Scanning Transmission Electron Microscope ◽  
Aperture Size ◽  
Magnetic Lens ◽  
Peak Intensity ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Half Angle

The scanning transmission electron microscope (STEM) constructed by the authors employs a field emission gun and a 1.15 mm focal length magnetic lens to produce a probe on the specimen. The aperture size is chosen to allow one wavelength of spherical aberration at the edge of the objective aperture. Under these conditions the profile of the focused spot is expected to be similar to an Airy intensity distribution with the first zero at the same point but with a peak intensity 80 per cent of that which would be obtained If the lens had no aberration. This condition is attained when the half angle that the incident beam subtends at the specimen, 𝛂 = (4𝛌/Cs)¼

The Reduction of Chromatic Aberrations Due to Instrumental Instabilities

1971 ◽  
Vol 29 ◽  
pp. 14-15
Author(s):  
J. S. Lally ◽  
R. Evans
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Usual Practice ◽  
Voltage Electron ◽  
Short Focal Length ◽  
Chromatic Aberrations ◽  
Electron Microscopes

One of the instrumental factors often limiting the resolution of the electron microscope is image defocussing due to changes in accelerating voltage or objective lens current. This factor is particularly important in high voltage electron microscopes both because of the higher voltages and lens currents required but also because of the inherently longer focal lengths, i.e. 6 mm in contrast to 1.5-2.2 mm for modern short focal length objectives.The usual practice in commercial electron microscopes is to design separately stabilized accelerating voltage and lens supplies. In this case chromatic aberration in the image is caused by the random and independent fluctuations of both the high voltage and objective lens current.

A Superconducting Microscope

1971 ◽  
Vol 29 ◽  
pp. 10-11 ◽  
Author(s):  
R. E. Worsham ◽  
J. E. Mann ◽  
E. G. Richardson
Keyword(s):  
Liquid Helium ◽  
Focal Length ◽  
Vacuum System ◽  
Objective Lens ◽  
Electrical Instability ◽  
Radiation Shields ◽  
And Control ◽  
Thermal Oscillations ◽  
Flux Pump

This superconducting microscope, Figure 1, was first operated in May, 1970. The column, which started life as a Siemens Elmiskop I, was modified by removing the objective and intermediate lenses, the specimen chamber, and the complete vacuum system. The large cryostat contains the objective lens and stage. They are attached to the bottom of the 7-liter helium vessel and are surrounded by two vapor-cooled radiation shields.In the initial operational period 5-mm and 2-mm focal length objective lens pole pieces were used giving magnification up to 45000X. Without a stigmator and precision ground pole pieces, a resolution of about 50-100Å was achieved. The boil-off rate of the liquid helium was reduced to 0.2-0.3ℓ/hour after elimination of thermal oscillations in the cryostat. The calculated boil-off was 0.2ℓ/hour. No effect caused by mechanical or electrical instability was found. Both 4.2°K and 1.7-1.9°K operation were routine. Flux pump excitation and control of the lens were quite smooth, simple, and, apparently highly stable. Alignment of the objective lens proved quite awkward, however, with the long-thin epoxy glass posts used for supporting the lens.

Improvements in the electron probe forming capabilities and x-ray hole counts in the Philips TEM

1983 ◽  
Vol 41 ◽  
pp. 376-377
Author(s):  
Richard L. McConville
Keyword(s):  
Field Strength ◽  
Electron Probe ◽  
Spherical Aberration ◽  
Focal Length ◽  
Objective Lens ◽  
Parallel Beam ◽  
Tilt Axis ◽  
X Ray ◽  
Small Probe ◽  
Specimen Height

A second generation twin lens has been developed. This symmetrical lens with a wider bore, yet superior values of chromatic and spherical aberration for a given focal length, retains both eucentric ± 60° tilt movement and 20°x ray detector take-off angle at 90° to the tilt axis. Adjust able tilt axis height, as well as specimen height, now ensures almost invariant objective lens strengths for both TEM (parallel beam conditions) and STEM or nano probe (focused small probe) modes.These modes are selected through use of an auxiliary lens situ ated above the objective. When this lens is on the specimen is illuminated with a parallel beam of electrons, and when it is off the specimen is illuminated with a focused probe of dimensions governed by the excitation of the condenser 1 lens. Thus TEM/STEM operation is controlled by a lens which is independent of the objective lens field strength.

Comparison of Deterministic and Linear Cosine Spatial Filtering of Transmission Electron Micrographs

1972 ◽  
Vol 30 ◽  
pp. 596-597
Author(s):  
David A. Ansley
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Spatial Filter ◽  
Operating Conditions ◽  
Objective Lens ◽  
List Type ◽  
Spatial Filters ◽  
Transmission Electron ◽  
Wide Range

The coherence of the electron flux of a transmission electron microscope (TEM) limits the direct application of deconvolution techniques which have been used successfully on unmanned spacecraft programs. The theory assumes noncoherent illumination. Deconvolution of a TEM micrograph will, therefore, in general produce spurious detail rather than improved resolution.A primary goal of our research is to study the performance of several types of linear spatial filters as a function of specimen contrast, phase, and coherence. We have, therefore, developed a one-dimensional analysis and plotting program to simulate a wide 'range of operating conditions of the TEM, including adjustment of the:(1) Specimen amplitude, phase, and separation(2) Illumination wavelength, half-angle, and tilt(3) Objective lens focal length and aperture width(4) Spherical aberration, defocus, and chromatic aberration focus shift(5) Detector gamma, additive, and multiplicative noise constants(6) Type of spatial filter: linear cosine, linear sine, or deterministic

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