Low-frequency noise measurements as an analysis and prediction tool for the reliability evaluation of 808 nm laser diodes

2020 ◽  
Vol 59 (34) ◽  
pp. 10920
Author(s):  
Chang Qu ◽  
Xiaojuan Chen
Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  

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