Digital Evaluation of the Complex Index of Refraction from Reflectance Data*

1965 ◽  
Vol 55 (3) ◽  
pp. 295 ◽  
Author(s):  
D. W. Juenker
Keyword(s):  
Index Of Refraction ◽  
Complex Index ◽  
Digital Evaluation ◽  
Reflectance Data ◽  
Complex Index Of Refraction

scholarly journals Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus

Materials ◽  
2020 ◽  
Vol 13 (24) ◽  
pp. 5736
Author(s):  
Aaron M. Ross ◽  
Giuseppe M. Paternò ◽  
Stefano Dal Conte ◽  
Francesco Scotognella ◽  
Eugenio Cinquanta
Keyword(s):  
Optical Constants ◽  
Transition Metal Dichalcogenides ◽  
Black Phosphorus ◽  
Index Of Refraction ◽  
Refractive Indices ◽  
Complex Index ◽  
Metal Dichalcogenides ◽  
Reflectance Data ◽  
Complex Index Of Refraction

In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.

Optical properties of amorphous hydrogenated carbon films: A spectroscopic ellipsometry study

1987 ◽  
Vol 2 (5) ◽  
pp. 645-647 ◽  
Author(s):  
Shuhan Lin ◽  
Shuguang Chen
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Carbon Films ◽  
Index Of Refraction ◽  
The Real ◽  
Complex Index ◽  
Tentative Explanation ◽  
Amorphous Hydrogenated Carbon ◽  
Ellipsometry Data ◽  
Complex Index Of Refraction

Optical properties of plasma-deposited amorphous hydrogenated carbon films were studied by spectroscopic ellipsometry. From the ellipsometry data, the real and imaginary parts, n and k, of the complex index of refraction of the film have been deduced for photon energies between 2.0 and 4.0 eV for as-grown as well as for thermally annealed films. Here n and k showed considerable variation with subsequent annealing, even under 400°C. A tentative explanation of the results is proposed.

Complex index of refraction of dental enamel at CO_2 laser wavelengths

1987 ◽  
Vol 26 (20) ◽  
pp. 4447 ◽  
Author(s):  
Gaetan Duplain ◽  
Russell Boulay ◽  
P. A. Bélanger
Keyword(s):  
Dental Enamel ◽  
Index Of Refraction ◽  
Complex Index ◽  
Complex Index Of Refraction
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