Theory of Gaussian beam Z scan with simultaneous third- and fifth-order nonlinear refraction based on a Gaussian decomposition method

2005 ◽  
Vol 22 (12) ◽  
pp. 2651 ◽  
Author(s):  
Bing Gu ◽  
Jing Chen ◽  
Ya-Xian Fan ◽  
Jianping Ding ◽  
Hui-Tian Wang
Optik ◽  
2012 ◽  
Vol 123 (8) ◽  
pp. 744-747
Author(s):  
Shi-Zhuan Lu ◽  
Kai-Ming You ◽  
Deng-Yu Zhang ◽  
Feng Gao

2018 ◽  
Vol 8 (10) ◽  
pp. 1810 ◽  
Author(s):  
Rihan Wu ◽  
Jack Collins ◽  
Leigh Canham ◽  
Andrey Kaplan

We present an experimental investigation into the third-order nonlinearity of conventional crystalline (c-Si) and porous (p-Si) silicon with Z-scan technique at 800-nm and 2.4- μ m wavelengths. The Gaussian decomposition method is applied to extract the nonlinear refractive index, n 2 , and the two-photon absorption (TPA) coefficient, β , from the experimental results. The nonlinear refractive index obtained for c-Si is 7 ± 2 × 10 − 6 cm 2 /GW and for p-Si is − 9 ± 3 × 10 − 5 cm 2 /GW. The TPA coefficient was found to be 2.9 ± 0.9 cm/GW and 1.0 ± 0.3 cm/GW for c-Si and p-Si, respectively. We show an enhancement of the nonlinear refraction and a suppression of TPA in p-Si in comparison to c-Si, and the enhancement gets stronger as the wavelength increases.


1996 ◽  
Vol 32 (15) ◽  
pp. 1356 ◽  
Author(s):  
T. Evers ◽  
H. Dahl ◽  
T. Wriedt
Keyword(s):  

2020 ◽  
Vol 18 (1) ◽  
pp. 738-748 ◽  
Author(s):  
Hijaz Ahmad ◽  
Tufail A. Khan ◽  
Shao-Wen Yao

Abstract The main aim of this article is to use a new and simple algorithm namely the modified variational iteration algorithm-II (MVIA-II) to obtain numerical solutions of different types of fifth-order Korteweg-de Vries (KdV) equations. In order to assess the precision, stability and accuracy of the solutions, five test problems are offered for different types of fifth-order KdV equations. Numerical results are compared with the Adomian decomposition method, Laplace decomposition method, modified Adomian decomposition method and the homotopy perturbation transform method, which reveals that the MVIA-II exceptionally productive, computationally attractive and has more accuracy than the others.


Nanomaterials ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 2485
Author(s):  
Jijuan Jiang ◽  
Yang Jia ◽  
Tong Wu ◽  
Yachen Gao

The nonlinear refraction of silver nanoparticles (AgNPs) in n-hexane was studied by using the closed-aperture Z-scan technique with a 532 nm nanosecond laser. It was found that, the nonlinear refraction of AgNPs shows the coexistence and transformation from self-focusing to self-defocusing. Specifically, self-focusing occurs at low excitation intensity, self-defocusing occurs at high excitation intensity, and coexistence of self-focusing and self-defocusing occurs at relatively moderate excitation intensity. The experimental results were analysed and discussed in terms of third-order and fifth-order nonlinear refractive effect. Specifically, the self-focusing is caused by the positive third-order nonlinear refraction, the self-defocusing is induced by the negative fifth-order nonlinear refraction, and the transformation from the self-focusing to self-defocusing at medium excitation intensity is caused by the competition of third-order and fifth-order nonlinear refraction. Finally, the third-order refractive index and fifth-order refractive index were obtained.


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