High resolution imaging by electron-beam excitation assisted optical microscope with emission layer for a brighter nanometric light source

2013 ◽  
Author(s):  
Y. Masuda ◽  
Y. Nawa ◽  
C. Morita ◽  
M. Kamiya ◽  
W. Inami ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Light Source ◽  
Optical Microscope ◽  
High Resolution Imaging ◽  
Emission Layer ◽  
Electron Beam Excitation ◽  
Resolution Imaging ◽  
Beam Excitation

scholarly journals Electron beam excitation assisted optical microscope with ultra-high resolution

2010 ◽  
Vol 18 (12) ◽  
pp. 12897 ◽  
Author(s):  
Wataru Inami ◽  
Kentaro Nakajima ◽  
Atsuo Miyakawa ◽  
Yoshimasa Kawata
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Optical Microscope ◽  
Electron Beam Excitation ◽  
Beam Excitation

The method of replication affects metal film granularity and resolution

1989 ◽  
Vol 47 ◽  
pp. 708-709
Author(s):  
George C. Ruben
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Film Thickness ◽  
Single Molecule ◽  
Metal Film ◽  
Vertical Surface ◽  
High Resolution Imaging ◽  
Controllable Factors ◽  
Resolution Imaging

Single molecule resolution in electron beam sensitive, uncoated, noncrystalline materials has been impossible except in thin Pt-C replicas ≤ 150Å) which are resistant to the electron beam destruction. Previously the granularity of metal film replicas limited their resolution to ≥ 20Å. This paper demonstrates that Pt-C film granularity and resolution are a function of the method of replication and other controllable factors. Low angle 20° rotary , 45° unidirectional and vertical 9.7±1 Å Pt-C films deposited on mica under the same conditions were compared in Fig. 1. Vertical replication had a 5A granularity (Fig. 1c), the highest resolution (table), and coated the whole surface. 45° replication had a 9Å granulartiy (Fig. 1b), a slightly poorer resolution (table) and did not coat the whole surface. 20° rotary replication was unsuitable for high resolution imaging with 20-25Å granularity (Fig. 1a) and resolution 2-3 times poorer (table). Resolution is defined here as the greatest distance for which the metal coat on two opposing faces just grow together, that is, two times the apparent film thickness on a single vertical surface.

A plastic scintillator film for an electron beam-excitation assisted optical microscope

2015 ◽  
Vol 22 (2) ◽  
pp. 354-358 ◽  
Author(s):  
Wataru Inami ◽  
Masahiro Fukuta ◽  
Yuriko Masuda ◽  
Yasunori Nawa ◽  
Atsushi Ono ◽  
...  
Keyword(s):  
Electron Beam ◽  
Plastic Scintillator ◽  
Optical Microscope ◽  
Electron Beam Excitation ◽  
Beam Excitation

scholarly journals Diffraction Microscopy using 20-kV Electron Beam for Multi-Wall Carbon Nanotubes

2007 ◽  
Vol 1026 ◽  
Author(s):  
Osamu Kamimura ◽  
Kota Kawahara ◽  
Takahisa Doi ◽  
Takashi Dobashi ◽  
Takashi Abe ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
High Resolution ◽  
Low Energy ◽  
High Resolution Imaging ◽  
Diffractive Imaging ◽  
Characteristic Structure ◽  
Multi Wall Carbon Nanotubes ◽  
Resolution Imaging ◽  
Diffraction Microscopy

AbstractDiffraction microscopy (or diffractive imaging) with iterative phase retrieval was performed using a low-energy (20-keV) electron beam to verify the possibility of high-resolution imaging with low specimen damage. Diffraction patterns of fine and uniform multi-wall carbon nanotubes (MWCNT) were recorded without a post-specimen lens. One- and two-dimensional phase retrievals were processed from the diffraction pattern alone. The reconstructed object images reflected the characteristic structure of the MWCNT. These results show the possibility of high-resolution imaging with a low-energy electron beam.

High resolution fluorescent bio-imaging with electron beam excitation

Microscopy ◽  
2014 ◽  
Vol 63 (suppl 1) ◽  
pp. i16-i16 ◽  
Author(s):  
Yoshimasa Kawata ◽  
Yasunori Nawa ◽  
Wataru Inami
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Electron Beam Excitation ◽  
Bio Imaging ◽  
Beam Excitation
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