Design and simulations of an integrated photonic device that can optically detect the magnetization direction of its ultra-thin (∼12 nm) metal cladding, thus ‘reading’ the stored magnetic memory, are presented. The device is an unbalanced Mach Zehnder Interferometer (MZI) based on InP Membrane on Silicon (IMOS) platform. The MZI consists of a ferromagnetic thin-film cladding and a delay line in one branch, and a polarization converter in the other. It quantitatively measures the non-reciprocal phase shift caused by the Magneto-Optic Kerr Effect in the guided mode which depends on the memory bit’s magnetization direction. The current design is an analytical tool for research exploration of all-optical magnetic memory reading. It has been shown that the device is able to read a nanoscale memory bit (400 × 50 × 12 nm) by using a Kerr rotation as small as 0.2∘, in the presence of a noise ∼10 dB in terms of signal-to-noise ratio. The device is shown to tolerate performance reductions that can arise during the fabrication.
All-optical intensity fluctuation magnification using Kerr effect
