scholarly journals Effective absorption coefficient and effective thickness in attenuated total reflection spectroscopy

2021 ◽  
Vol 46 (4) ◽  
pp. 872
Author(s):  
A. Mendoza-Galván ◽  
J. G. Méndez-Lara ◽  
R. A. Mauricio-Sánchez ◽  
K. Järrendahl ◽  
H. Arwin
Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2449
Author(s):  
Marion Baillieul ◽  
Emeline Baudet ◽  
Karine Michel ◽  
Jonathan Moreau ◽  
Petr Němec ◽  
...  

The objective of this study is to demonstrate the successful functionalization of the surface of a chalcogenide infrared waveguide with the ultimate goal of developing an infrared micro-sensor device. First, a polyisobutylene coating was selected by testing its physico-chemical compatibility with a Ge-Sb-Se selenide surface. To simulate the chalcogenide platform infrared sensor, the detection of benzene, toluene, and ortho-, meta- and para-xylenes was efficaciously performed using a polyisobutylene layer spin-coated on 1 and 2.5 µm co-sputtered selenide films of Ge28Sb12Se60 composition deposited on a zinc selenide prism used for attenuated total reflection spectroscopy. The thickness of the polymer coating was optimized by attenuated total reflection spectroscopy to achieve the highest possible attenuation of water absorption while maintaining the diffusion rate of the pollutant through the polymer film compatible with the targeted in situ analysis. Then, natural water, i.e., groundwater, wastewater, and seawater, was sampled for detection measurement by means of attenuated total reflection spectroscopy. This study is a valuable contribution concerning the functionalization by a hydrophobic polymer compatible with a chalcogenide optical sensor designed to operate in the mid-infrared spectral range to detect in situ organic molecules in natural water.


2005 ◽  
Vol 86 (20) ◽  
pp. 201116 ◽  
Author(s):  
Robert Schiwon ◽  
Gerhard Schwaab ◽  
Erik Bründermann ◽  
Martina Havenith

2005 ◽  
Vol 45 (supplement) ◽  
pp. S238
Author(s):  
A. Kenmochi ◽  
T. Tanabe ◽  
Y. Oyma ◽  
K. Suto ◽  
J. Nishizawa ◽  
...  

2000 ◽  
Vol 609 ◽  
Author(s):  
Hiroyuki Fujiwara ◽  
Yasutake Toyoshima ◽  
Michio Kondo ◽  
Akihisa Matsuda

ABSTRACTWe have characterized a-Si:H initial layers for μc-Si:H nucleation by real time spectroscopic ellipsometry (SE) and infrared attenuated total reflection spectroscopy (ATR) to investigate the μc-Si:H formation mechanism. By performing Ar plasma treatment of a-Si:H layers, we confirmed a presence of a 2 monolayer thick sub-surface in a-Si:H layers. In the a-Si:H sub-surface that leads to the μc-Si:H nucleation, an important peak at ∼1937 cm−1 assigned to the SiHn complex was found in the ATR spectra. From H2 plasma treatment experiments, we proposed that this SiHn complex is formed by H insertion into strained Si-Si bonds. The SiHn complex formed in the a-Si:H sub-surface showed a clear relationship with the μc-Si:H nucleation. From these results, we conclude that the μc-Si:H nucleation occurs by the formation of the chemically active and flexible SiHn complexes in the 2 monolayer thick a-Si:H sub-surface.


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