A Simple Graphical Procedure for Rapid Estimation of Ash in Coal by X-Ray Back-Scattering

1985 ◽  
Vol 39 (3) ◽  
pp. 470-472
Author(s):  
H. D. Pandey ◽  
M. S. Prasad
Keyword(s):  
Rapid Determination ◽  
Calibration Procedure ◽  
Ash Content ◽  
Regression Equation ◽  
Rapid Estimation ◽  
X Ray ◽  
Back Scattering

This paper describes a simple graphical calibration procedure for rapid determination of ash content in coal samples. The results obtained with this procedure are compared with those obtained earlier with the use of a regression equation. The two results are found to be in agreement.

Rapid Determination of Ash in Coal by Compton Scattering, Ca, and Fe X-Ray Fluorescence

1979 ◽  
Vol 23 ◽  
pp. 45-55 ◽  
Author(s):  
Jacques Renault
Keyword(s):  
New Mexico ◽  
Fluorescence Spectroscopy ◽  
Absorption Coefficient ◽  
Compton Scattering ◽  
Rapid Determination ◽  
Ash Content ◽  
Average Error ◽  
Compton Wavelength ◽  
X Ray

AbstractThe intensity of Compton scattering, Fe, and Ca chatacteristic radiation can be used to estimate the amount of ash in coal by Xray fluorescence spectroscopy. Mo, W, and Cr radiation were used to study a suite of New Mexico coals, and the best results were obtained with Mo and W X-ray tubes. If the actual concentrations of Fe2O3 and CaO and the mass absorption coefficient, μ*, at the Compton wavelength of scattered Mo K radiation can be determined, the regression equation:%Ash - 24.2μ* - 6.28(%Fe2O3) - 1.96(%CaO) - 3.4estimates the ash content with an average error of 0.5% ash at 0.71Å.

scholarly journals Rapid determination of hydrogen positions and protonation states of diisopropyl fluorophosphatase by joint neutron and X-ray diffraction refinement

2009 ◽  
Vol 106 (3) ◽  
pp. 713-718 ◽  
Author(s):  
Marc-Michael Blum ◽  
Marat Mustyakimov ◽  
Heinz Rüterjans ◽  
Kai Kehe ◽  
Benno P. Schoenborn ◽  
...  
Keyword(s):  
Rapid Determination ◽  
X Ray Diffraction ◽  
X Ray

Rapid determination of arsenic in the presence of lead in a zinc sulphide matrix by X-ray fluorescence spectrometry

The Analyst ◽  
1988 ◽  
Vol 113 (8) ◽  
pp. 1325 ◽  
Author(s):  
Montserrat Baucells ◽  
Gloria Lacort ◽  
Montserrat Roura ◽  
Josefina de Gyves
Keyword(s):  
Rapid Determination ◽  
Zinc Sulphide ◽  
Fluorescence Spectrometry ◽  
X Ray

X-Ray Spectrometric Determination of Sulfate in Natural Waters

1979 ◽  
Vol 23 ◽  
pp. 133-141
Author(s):  
C. A. Seils ◽  
G. T. Tisue
Keyword(s):  
Natural Waters ◽  
Rapid Determination ◽  
Atomic Absorption Spectrophotometry ◽  
Good Choice ◽  
Small Samples ◽  
Selective Electrode ◽  
X Ray ◽  
Heavy Metal Cations ◽  
Improved Methods

A recent surge of interest in sulfur in the environment has revealed the need for improved methods of analysis for sulfate, SO4=, in rain, freshwater and sediment interstitial fluids. Ion chromatography permits the rapid determination of SO4= in the ppm range (1 ppm = 1 mgL'1 = 10 μmol L-1 sulfate) on relatively small samples with good specificity. If a suitable instrument is available, this technique is a good choice for many environmental analyses. Other approaches to sulfate analysis are based on its precipitation with organic or heavy metal cations, usually barium or lead. The amount of precipitate formed may be determined by inter alia gravimetry, turbidimetry, radiometry (using 133-Ba), atomic absorption spectrophotometry (Ba or Pb detection), potentiometry (using a Pb++ ion selective electrode) , colorimetry, or by x-ray fluorescence spectrometry (Ba, Pb or S detection)(1). Because of our experience with x-ray fluorescence analyses, we chose to develop and test a procedure using that technique.

Determination of Ultra-Thin Carbon Coating Thickness by X-ray Fluorescence Technique

1988 ◽  
Vol 32 ◽  
pp. 331-339
Author(s):  
R. L. White ◽  
T. C. Huang
Keyword(s):  
Film Thickness ◽  
Carbon Coating ◽  
Layer Structure ◽  
Carbon Film ◽  
Calibration Procedure ◽  
High Precision Measurement ◽  
X Ray ◽  
Thin Carbon ◽  
Counting Time

AbstractA tcchniquc for high-precision measurement of carbon thin-film thickness using X-ray fluorescence (XRF) is described. A quadratic calibration procedure is used for carbon thin films on silicon. Measurement of carbon-film thickness in a double-layer structure of carbon and CoCrX alloy is complicated by interference effects from the underlying layer. The dependence of the relative precision in measuring thickness (σT/T) on the counting time has been derived. It shows that a precision of 2% for a 25-nm carbon coating can be obtained using a W/C crystal and counting time of 4 minutes. Intensity and resolution advantages provided by the recently developed Ni/C and V/C multilayer synthetic crystals are also described.

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