Thin-Film Optical Constants Determined from Infrared Reflectance and Transmittance Measurements

1989 ◽  
Vol 43 (6) ◽  
pp. 1027-1032 ◽  
Author(s):  
Thierry Buffeteau ◽  
Bernard Desbat
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Grazing Incidence ◽  
Infrared Region ◽  
Matrix Formalism ◽  
Experimental Conditions ◽  
Reflection And Transmission ◽  
Transmission Coefficients ◽  
Multilayered Systems

A general method based upon reflectance and transmittance measurements in the infrared region has been developed for the determination of the optical constants n( v) and k( v) of thin films deposited on any substrate (transparent or not). The corresponding computer program, written in FORTRAN 77, involves three main parts: (1) a matrix formalism to compute reflection and transmission coefficients of multilayered systems; (2) an iterative Newton-Raphson method to estimate the optical constants by comparison of the calculated and experimental values; and (3) a fast Kramers-Krönig transform to improve the accuracy of calculating the refractive index. The first part of this program can be used independently to simulate reflection and transmission spectra of any multilayered system using various experimental conditions. Two practical examples are given for illustration. Simulation of reflection spectra at grazing incidence for thin films deposited on a metal surface and determination of the optical constants for thin CaF2 layers deposited on a silicon substrate are presented.

Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

1981 ◽  
Vol 20 (9) ◽  
pp. L665-L668 ◽  
Author(s):  
Satoshi Yamasaki ◽  
Hideyo Okushi ◽  
Akihisa Matsuda ◽  
Hidetoshi Oheda ◽  
Nobuhiro Hata ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoacoustic Spectroscopy ◽  
Optical Constants

scholarly journals WAVE TRANSMISSION THROUGH TRAPEZOIDAL BREAKWATERS

1978 ◽  
Vol 1 (16) ◽  
pp. 129 ◽  
Author(s):  
Ole Secher Madsen ◽  
Paisal Shusang ◽  
Sue Ann Hanson
Keyword(s):  
Energy Dissipation ◽  
Approximate Method ◽  
Cross Section ◽  
Wave Energy ◽  
Graphical Form ◽  
Dissipated Energy ◽  
Simple Method ◽  
Reflection And Transmission ◽  
Transmission Coefficients

In a previous paper Madsen and White (1977) developed an approximate method for the determination of reflection and transmission characteristics of multi-layered, porous rubble-mound breakwaters of trapezoidal cross-section. This approximate method was based on the assumption that the energy dissipation associated with the wave-structure interaction could be considered as two separate mechanisms: (1) an external, frictional dissipation on the seaward slope; (2) an internal dissipation within the porous structure. The external dissipation on the seaward slope was evaluated from the semi-theoretical analysis of energy dissipation on rough, impermeable slopes developed by Madsen and White (1975). The remaining wave energy was represented by an equivalent wave incident on a hydraulically equivalent porous breakwater of rectangular cross-section. The partitioning of the remaining wave energy among reflected, transmitted and internally dissipated energy was evaluated as described by Madsen (1974), leading to a determination of the reflection and transmission coefficients of the structure. The advantage of this previous approximate method was its ease of use. Input data requirements were limited to quantities which would either be known (water depth, wave characteristics, breakwater geometry, and stone sizes) or could be estimated (porosity) by the design engineer. This feature was achieved by the employment of empirical relationships for the parameterization of the external and internal energy dissipation mechanisms. General solutions were presented in graphical form so that calculations could proceed using no more sophisticated equipment than a hand calculator (or a slide rule). This simple method gave estimates of transmission coefficients in excellent agreement with laboratory measurements whereas its ability to predict reflection coefficients left a lot to be desired.

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

scholarly journals Experimental Determination of Complex Optical Constants of Air‐Stable Inorganic CsPbI 3 Perovskite Thin Films

2020 ◽  
Vol 14 (6) ◽  
pp. 2000070 ◽  
Author(s):  
Wensheng Yan ◽  
Yi Guo ◽  
Deski Beri ◽  
Stephan Dottermusch ◽  
Haining Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Optical Constants

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

2001 ◽  
Vol 40 (28) ◽  
pp. 5088 ◽  
Author(s):  
Chubing Peng ◽  
Rongguang Liang ◽  
J. Kevin Erwin ◽  
Warren Bletscher ◽  
Kenichi Nagata ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Multilayer Stacks

Determination of the optical constants and thickness of amorphous V2O5 thin films

1983 ◽  
Vol 102 (1) ◽  
pp. 71-76 ◽  
Author(s):  
L. Michailovits ◽  
I. Hevesi ◽  
Liem Phan ◽  
ZS. Varga
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
V2o5 Thin Films

Grazing-incidence X-Ray Analysis of Surfaces and Thin Films

1991 ◽  
Vol 35 (A) ◽  
pp. 143-150 ◽  
Author(s):  
T. C. Huang
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Grazing Incidence ◽  
Bragg Diffraction ◽  
Interface Roughness ◽  
Phase Identification ◽  
X Ray ◽  
Types Of Information

AbstractGrazing-incidence X-ray analysis techniques which are commonly used for the nondestructive characterization of surfaces and thin films are reviewed. The X-ray reflectivity technicue is used to study surface uniformity and oxidation, layer thickness and density, interface roughness and diffusion, etc. The grazing-incidence in-plane diffraction technique is used to determine in-plane crystallography of epitaxial films. The grazing-incidence asymmetric-Bragg diffraction is used for surface phase identification and structural depth profiling determination of polycrystalline films. Typical examples to illustrate the types of information that can be obtained by the techniques are presented.

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