scholarly journals Scanning Probe Microscopy: Present Status and New Development. Status and Development of Atomic Force Microscopy.

Hyomen Kagaku ◽  
1999 ◽  
Vol 20 (5) ◽  
pp. 352-357
Author(s):  
Seizo MORITA ◽  
Yasuhiro SUGAWARA
2007 ◽  
Vol 60 (1) ◽  
pp. 183-187
Author(s):  
Fabricio Simão dos Santos ◽  
Simoni Maria Gheno ◽  
Sebastião Elias Kuri

Nesse trabalho, a microscopia de varredura por sonda (Scanning Probe Microscopy - SPM), nos modos contato (Atomic Force Microscopy - AFM) e de força magnética (Magnetic Force Microscopy - MFM), foi utilizada para analisar a microestrutura de um aço inoxidável dúplex 2205 solubilizado e envelhecido. Foi feita uma análise por AFM da superfície do aço solubilizado após crescimento de filme passivo. Por AFM, obteve-se indicação de crescimento de filme sobre a microestrutura do aço solubilizado, enquanto por MFM a distribuição de fases pôde ser observada sem a necessidade de ataque da superfície.


2009 ◽  
Vol 17 (2) ◽  
pp. 26-29
Author(s):  
Monteith G. Heaton ◽  
Jason P. Cleveland

Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. However, aside from some interesting tweaks, add-ons and repackaging, the field has seen no fundamentally new instruments for several years. For the extremely high-resolution AFM/SPMs, there has literally been no completely new microscope for well over a decade. We report here on the new CypherTM AFM from Asylum Research (Figure 1). that delivers upgrades from the existing field of older AFM/SPMs on a variety of levels.


2021 ◽  
Vol 3 ◽  
Author(s):  
I.V. Yaminsky ◽  

The article is devoted to the study of viruses and bacteria using a scanning probe microscope in the atomic force microscopy mode, in particular, to the question, what data can be obtained using this method and how to interpret it.


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