In situ TEM probing properties of individual one-dimensional nanostructures

2007 ◽  
Vol 4 (1/2) ◽  
pp. 119 ◽  
Author(s):  
X.D. Bai ◽  
Zhi Xu ◽  
K.H. Liu ◽  
E.G. Wang
2017 ◽  
Vol 78 (2) ◽  
pp. 20701
Author(s):  
Florian Banhart ◽  
Alessandro La Torre ◽  
Ferdaous Ben Romdhane ◽  
Ovidiu Cretu

The article is a brief review on the potential of transmission electron microscopy (TEM) in the investigation of atom chains which are the paradigm of a strictly one-dimensional material. After the progress of TEM in the study of new two-dimensional materials, microscopy of free-standing one-dimensional structures is a new challenge with its inherent potentials and difficulties. In-situ experiments in the TEM allowed, for the first time, to generate isolated atomic chains consisting of metals, carbon or boron nitride. Besides having delivered a solid proof for the existence of atomic chains, in-situ TEM studies also enabled us to measure the electrical properties of these fundamental linear structures. While ballistic quantum conductivity is observed in chains of metal atoms, electrical transport in chains of sp1-hybridized carbon is limited by resonant states and reflections at the contacts. Although substantial progress has been made in recent TEM studies of atom chains, fundamental questions have to be answered, concerning the structural stability of the chains, bonding states at the contacts, and the suitability for applications in nanotechnology.


Langmuir ◽  
2012 ◽  
Vol 28 (14) ◽  
pp. 5947-5955 ◽  
Author(s):  
Marie V. Walter ◽  
Nicolas Cheval ◽  
Olimpia Liszka ◽  
Michael Malkoch ◽  
Amir Fahmi

Author(s):  
Utkarsha Singh ◽  
Alexis Abramson ◽  
Vikas Prakash

This paper presents the design and development of a nano-mechanical, electrical and thermal (NMET) characterization tool for coupled measurements of one-dimensional nanostructures. The device is designed to operate inside an environmental scanning electron microscope (ESEM) to facilitate in-situ imaging, positioning and testing. The design includes a custom nanomanipulator system, which assists in controlled placement of individual one-dimensional nanostructures (specimens) between two probes. Sample straining and unique direct force and displacement measurements are achieved by the use of a commercially available actuator. The “next generation” tool is also discussed.


2008 ◽  
Vol 112 (15) ◽  
pp. 5865-5868 ◽  
Author(s):  
Leshu Yu ◽  
Yanwen Ma ◽  
Jianmin Zhu ◽  
Hui Feng ◽  
Qiang Wu ◽  
...  

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