Multiple Diffraction of X-Rays

1982 ◽  
Vol 37 (5) ◽  
pp. 437-447 ◽  
Author(s):  
Roberto Colella
Keyword(s):  
High Resolution ◽  
X Rays ◽  
Bragg Scattering ◽  
Multiple Diffraction ◽  
Phase Determination ◽  
Method Of Solution ◽  
Electric Effect ◽  
Effect Phase ◽  
Theory And Experiment ◽  
General Method

The phenomenon of n-be&m diffraction (n>2) is discussed with particular attention being devoted to the Bragg case of diffraction. The general method of solution is outlined, and some applications to specific situations are discussed. These include experiments in which strong quasi- monochromatic phonon beams are excited in a crystal using the Acousto-Electric effect, phase determination using the concept of „Virtual Bragg Scattering”, and high resolution Bragg reflec­tion topographs. In all cases the agreement between theory and experiment has been found excellent.

Feasibility of phase determination in quasicrystals and microcrystals by means of multiple bragg scattering

1994 ◽  
Vol 209 (5) ◽  
Author(s):  
M. Bessière ◽  
S. Lefèbvre ◽  
H. Lee ◽  
R. Colella ◽  
T. Motsch ◽  
...  
Keyword(s):  
Icosahedral Symmetry ◽  
Bragg Scattering ◽  
Phase Information ◽  
Multiple Diffraction ◽  
Phase Determination ◽  
Rhombohedral Crystal

AbstractMultiple diffraction experiments have been performed on a microcrystal and a quasicrystal of the Al–Cu–Fe alloy for the purpose of extracting phase information. The microcrystal used in this work is a twinned rhombohedral crystal exhibiting overall icosahedral symmetry. The experiments are performed by rotating the specimen around the scattering vector, (

Phase determination using high-order multiple diffraction of X-rays

1988 ◽  
Vol 44 (1) ◽  
pp. 63-70 ◽  
Author(s):  
S.-L. Chang ◽  
H.-H. Hong ◽  
S.-W. Luh ◽  
H.-H. Pan ◽  
M.-C. Tang ◽  
...  
Keyword(s):  
High Order ◽  
X Rays ◽  
Multiple Diffraction ◽  
Phase Determination

scholarly journals Phase determination of structure-factor triplets and quartets using high-order multiple diffraction of X-rays

1987 ◽  
Vol 43 (a1) ◽  
pp. C283-C283
Author(s):  
S.-L. Chang ◽  
H.-H. Huang ◽  
S.-W. Luh ◽  
H.-P. Pan ◽  
M. T. Tang ◽  
...  
Keyword(s):  
Structure Factor ◽  
High Order ◽  
X Rays ◽  
Multiple Diffraction ◽  
Phase Determination

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

scholarly journals Measurement of synchrotron-radiation-excited Kossel patterns

2016 ◽  
Vol 23 (1) ◽  
pp. 214-218 ◽  
Author(s):  
G. Bortel ◽  
G. Faigel ◽  
M. Tegze ◽  
A. Chumakov
Keyword(s):  
High Resolution ◽  
Dynamic Range ◽  
Structural Information ◽  
Photon Counting ◽  
Spot Size ◽  
Low Noise ◽  
X Rays ◽  
Technical Problems ◽  
Pixel Detectors ◽  
Exciting Beam

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

Cryogenic high-resolution X-ray spectrometers for SR-XRF and microanalysis

1998 ◽  
Vol 5 (3) ◽  
pp. 515-517 ◽  
Author(s):  
M. Frank ◽  
C. A. Mears ◽  
S. E. Labov ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
Superconducting Tunnel Junction ◽  
Semiconductor Detectors ◽  
X Rays ◽  
X Ray ◽  
Sr Xrf ◽  
Demonstration Experiment ◽  
Near Future ◽  
Stj Detector

Experimental results are presented obtained with a cryogenically cooled high-resolution X-ray spectrometer based on a 141 × 141 µm Nb-Al-Al2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates approaching those of semiconductor detectors while still providing a significantly better energy resolution for soft X-rays. By measuring fluorescence X-rays from samples containing transition metals and low-Z elements, an FWHM energy resolution of 6–15 eV for X-rays in the energy range 180–1100 eV has been obtained. The results show that, in the near future, STJ detectors may prove very useful in XRF and microanalysis applications.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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