High-resolution achromatic X-ray optical systems for broad-band imaging and for focusing attosecond pulses

Achromatic focusing systems for hard X-rays are examined which consist of a refractive lens paired with a diffractive lens. Compared with previous analyses, we take into account the behaviour of thick refractive lenses, such as compound refractive lenses and waveguide gradient index refractive lenses, in which both the focal length and the position of the principal planes vary with wavelength. Achromatic systems formed by the combination of such a thick refractive lens with a multilayer Laue lens are found that can operate at a focusing resolution of about 3 nm, over a relative bandwidth of about 1%. With the appropriate distance between the refractive and diffractive lenses, apochromatic systems can also be found, which operate over relative bandwidth greater than 10%. These systems can be used to focus short pulses without distorting them in time by more than several attoseconds. Such systems are suitable for high-flux scanning microscopy and for creating high intensities from attosecond X-ray pulses.

A deep study of the high–energy transient sky

The coming decades will establish the exploration of the gravitational wave (GW) Universe over a broad frequency range by ground and space interferometers. Meanwhile, wide-field, high-cadence and sensitive surveys will span the electromagnetic spectrum from radio all the way up to TeV, as well as the high-energy neutrino window. Among the numerous classes of transients, γ–ray bursts (GRBs) have direct links with most of the hot topics that will be addressed, such as the strong gravity regime, relativistic shocks, particle acceleration processes, equation of state of matter at nuclear density, and nucleosynthesis of heavy elements, just to mention a few. Other recently discovered classes of transients that are observed throughout cosmological distances include fast radio bursts (FRBs), fast blue optical transients (FBOTs), and other unidentified high-energy transients. Here we discuss how these topics can be addressed by a mission called ASTENA (Advanced Surveyor of Transient Events and Nuclear Astrophysics, see Frontera et al. 18). Its payload combines two instruments: (i) an array of wide-field monitors with imaging, spectroscopic, and polarimetric capabilities (WFM-IS); (ii) a narrow field telescope (NFT) based on a Laue lens operating in the 50–600 keV range with unprecedented angular resolution, polarimetric capabilities, and sensitivity.

Ptychographic X-ray speckle tracking with multi-layer Laue lens systems

The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-wavelength characterization method. To this end, a modified form of the speckle tracking wavefront metrology method has been developed. The ptychographic X-ray speckle tracking method is capable of operating with highly divergent wavefields. A useful by-product of this method is that it also provides high-resolution and aberration-free projection images of extended specimens. Three separate experiments using this method are reported, where the ray path angles have been resolved to within 4 nrad with an imaging resolution of 45 nm (full period). This method does not require a high degree of coherence, making it suitable for laboratory-based X-ray sources. Likewise, it is robust to errors in the registered sample positions, making it suitable for X-ray free-electron laser facilities, where beam-pointing fluctuations can be problematic for wavefront metrology.