Application of Electronic Load Circuit for Electrical Safety by using a Serial Mode Comparator

2020 ◽  
Vol 1 (4) ◽  
pp. 19-24
Author(s):  
Saktanong WONGCHAROEN
2014 ◽  
Vol 556-562 ◽  
pp. 1811-1813 ◽  
Author(s):  
Xue Fei Yan ◽  
Chang Qing Zhu ◽  
Yue Fei Zhao ◽  
Qiao Jing An

The AC electronic load circuit is studied, PWM converter is used in this circuit in order to achieve the simulation function of load characteristics.The methods of how to get the command current mathematical model and simulation module is given which is based of the Matlab/Simulink platform, Hysteresis control mode is used in order to get fast and stable actual current and then carried on the simulation of the proposed electronic load. The simulation results show that the proposed algorithm and the control instruction current method and the effectiveness of the current control method, realized the simulation of ac electronic load.


Author(s):  
John Silcox

Determination of the microstructure and microchemistry of small features often provides the insight needed for the understanding of processes in real materials. In many cases, it is not adequate to use microscopy alone. Microdiffraction and microspectroscopic information such as EELS, X-ray microprobe analysis and Auger spectroscopy can all contribute vital parts of the picture. For a number of reasons, dedicated STEM offers considerable promise as a quantitative instrument. In this paper, we review progress towards effective quantitative use of STEM with illustrations drawn from studies of high Tc superconductors, compound semiconductors and metallization of H-terminated silicon.Intrinsically, STEM is a quantitative instrument. Images are acquired directly by detectors in serial mode which is particularly convenient for digital image acquisition, control and display. The VG HB501A at Cornell has been installed in a particularly stable electromagnetic, vibration and acoustic environment. Care has been paid to achieving UHV conditions (i.e., 10-10 Torr). Finally, it has been interfaced with a VAX 3200 work station by Kirkland. This permits, for example, the acquisition of bright field (or energy loss) images and dark field images simultaneously as quantitative arrays in perfect registration.


2005 ◽  
Vol 2 (2) ◽  
pp. 25
Author(s):  
Noraliza Hamzah ◽  
Wan Nor Ainin Wan Abdullah ◽  
Pauziah Mohd Arsad

Power Quality disturbances problems have gained widespread interest worldwide due to the proliferation of power electronic load such as adjustable speed drives, computer, industrial drives, communication and medical equipments. This paper presents a technique based on wavelet and probabilistic neural network to detect and classify power quality disturbances, which are harmonic, voltage sag, swell and oscillatory transient. The power quality disturbances are obtained from the waveform data collected from premises, which include the UiTM Sarawak, Faculty of Science Computer in Shah Alam, Jati College, Menara UiTM, PP Seksyen 18 and Putra LRT. Reliable Power Meter is used for data monitoring and the data is further processed using the Microsoft Excel software. From the processed data, power quality disturbances are detected using the wavelet technique. After the disturbances being detected, it is then classified using the Probabilistic Neural Network. Sixty data has been chosen for the training of the Probabilistic Neural Network and ten data has been used for the testing of the neural network. The results are further interfaced using matlab script code.  Results from the research have been very promising which proved that the wavelet technique and Probabilistic Neural Network is capable to be used for power quality disturbances detection and classification.


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