Logistic regression in image reconstruction in electrical impedance tomography

2020 ◽  
Vol 1 (5) ◽  
pp. 97-100
Author(s):  
Edward KOZŁOWSKI
Author(s):  
Tomasz Rymarczyk ◽  
Edward Kozłowski ◽  
Paweł Tchórzewski ◽  
Grzegorz Kłosowski ◽  
Przemysław Adamkiewicz

The article presents machine learning methods in the field of reconstruction of tomographic images. The presented research results show that electric tomography makes it possible to analyze objects without interfering with them. The work focused mainly on electrical impedance tomography and image reconstruction using deterministic methods and machine learning, reconstruction results were compared and various numerical models were used. The main advantage of the presented solution is the ability to analyze spatial data and high speed of processing. The implemented algorithm based on logistic regression is promising in image reconstruction. In addition, the elastic net method was used to solve the problem of selecting input variables in the regression model.


Sensor Review ◽  
2017 ◽  
Vol 37 (3) ◽  
pp. 257-269 ◽  
Author(s):  
Qi Wang ◽  
Pengcheng Zhang ◽  
Jianming Wang ◽  
Qingliang Chen ◽  
Zhijie Lian ◽  
...  

Purpose Electrical impedance tomography (EIT) is a technique for reconstructing the conductivity distribution by injecting currents at the boundary of a subject and measuring the resulting changes in voltage. Image reconstruction for EIT is a nonlinear problem. A generalized inverse operator is usually ill-posed and ill-conditioned. Therefore, the solutions for EIT are not unique and highly sensitive to the measurement noise. Design/methodology/approach This paper develops a novel image reconstruction algorithm for EIT based on patch-based sparse representation. The sparsifying dictionary optimization and image reconstruction are performed alternately. Two patch-based sparsity, namely, square-patch sparsity and column-patch sparsity, are discussed and compared with the global sparsity. Findings Both simulation and experimental results indicate that the patch based sparsity method can improve the quality of image reconstruction and tolerate a relatively high level of noise in the measured voltages. Originality/value EIT image is reconstructed based on patch-based sparse representation. Square-patch sparsity and column-patch sparsity are proposed and compared. Sparse dictionary optimization and image reconstruction are performed alternately. The new method tolerates a relatively high level of noise in measured voltages.


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