scholarly journals Penentuan dan Analisis Resistivitas Thin Film dengan Identifikasi Sampel Menggunakan Metode Image Processing

Jurnal Fisika ◽  
2020 ◽  
Vol 10 (2) ◽  
pp. 42-49
Author(s):  
Vandri Ahmad Isnaini ◽  
Rahmi Putri Wirman ◽  
Shabri Putra Wirman ◽  
Hayyu Salma
Keyword(s):  

Telah dilakukan penelitian tentang penentuan dan analisis nilai resistivitas thin film dengan identifikasi ukuran sampel menggunakan metode image processing. Penelitian ini berupa perancangan, pengembangan, percobaan, dan analisis data percobaan. Analisis data percobaan dilakukan untuk melihat tingkat akurasi pada alat ini. Sampel yang diukur adalah thin film berbahan dasar Nikel Kobalt. Dari hasil percobaan, didapatkan bahwa alat ini bekerja dengan baik, walaupun digunakan untuk pengukuran sampel ukuran kecil. Alat juga memberikan data resistivitas yang akurat, dengan deviasi data yang kecil dibandingkan dengan data pengukuran secara manual. Pola yang dihasilkan dari hasil pengukuran alat ini dapat memberikan kesimpulan tentang pengaruh resistivitas terhadap variasi komposisi bahan dasar thin film.

2016 ◽  
Vol 1141 ◽  
pp. 51-53
Author(s):  
Chetan Zankat ◽  
V.M. Pathak ◽  
Pratik Pataniya ◽  
G.K. Solanki ◽  
K.D. Patel ◽  
...  

Amorphous SnSe thin films were deposited by thermal evaporation technique on glass substrates kept at room temperature in a vacuum better than 10-5Torr. A detailed study of structural and optical properties of 150 nm thin film was carried out. The selected area diffraction patterns obtained by TEM for this thin film were analyzed by a new method that involves accurate determination of lattice parameters by image processing software. The obtained results are in good agreement with the JCPDS data. Optical transmission spectra obtained at room temperature were analyzed to study optical properties of deposited thin films. It has been found that indirect carrier transition is responsible for optical absorption process in the deposited thin films.


2000 ◽  
Vol 13 (5) ◽  
pp. 597-601
Author(s):  
J.G. Jones ◽  
R.R. Biggers ◽  
J.D. Busbee ◽  
D.V. Dempsey ◽  
G. Kozlowski

2012 ◽  
Author(s):  
Sankaranaryanan Piramanayagam ◽  
Eli Saber ◽  
David Heavner

Open Physics ◽  
2004 ◽  
Vol 2 (4) ◽  
Author(s):  
Jiří Boldyš ◽  
Rudolf Hrach

AbstractIn experimental thin film physics, there is a demand to characterize a growing thin film or the thin film resulting from an experiment. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods is collected and further developed, which results in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles are analyzed in a multiscale manner. The descriptiveness of the proposed features is demonstrated on a few thin film photographs from real experiments. This work establishes a basis for further measurement, description, simulation or other processing in the physics of semicontinuous thin films, using any direct imaging modality.


1989 ◽  
Vol 28 (4) ◽  
pp. 737 ◽  
Author(s):  
Chong Hoon Kwak ◽  
Jong Tae Kim ◽  
Sang Soo Lee

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