Investigation of local light scattering properties of thin-film silicon solar cells with subwavelength resolution

2011 ◽  
Vol 1321 ◽  
Author(s):  
K. Bittkau ◽  
A. Hoffmann ◽  
J. Owen ◽  
R. Carius

ABSTRACTIn order to obtain efficient light trapping within a thin-film silicon solar cell, randomly textured interfaces are used. The texture can be introduced by wet-chemical etching in diluted hyrdofluoric acid (HF). By varying of the HF concentration, a continuous transition to smaller surface structures can be achieved. Near-field scanning optical microscopy is applied to measure scattered light with sub-wavelength resolution. On those different surfaces, using Fourier high-pass filters on the measured near-field images, surface features with a high light trapping potential are identified. Finally, criteria for optimized scattering surfaces are obtained.

2010 ◽  
Vol 19 (04) ◽  
pp. 645-651 ◽  
Author(s):  
T. BECKERS ◽  
K. BITTKAU ◽  
R. CARIUS

In thin-film silicon solar cell devices randomly textured interfaces are used to achieve light scattering sufficient for efficient light trapping. We use near-field scanning optical microscopy (NSOM) for visualizing wave guiding mechanisms experimentally by measuring the evanescent modes. Their impact on the light trapping efficiency and the link to topographic structures will be addressed.


2008 ◽  
Vol 1101 ◽  
Author(s):  
Ales Poruba ◽  
Petr Klapetek ◽  
Jakub Holovsky ◽  
Adam Purkrt ◽  
Milan Vanecek

AbstractNew approach for the determination of the angular distribution of the scattered light at nano-rough surfaces/interfaces from AFM (Atomic Force Microscopy) data is presented. Calculation comes from modeling the electromagnetic field in the tight vicinity of the nano-rough surface by complex solution of Maxwell's equations and subsequent near field to far field transform. This method is demonstrated for four types of transparent conductive oxides (with rough free surfaces) deposited on glass substrates. As a result we have the amount and angular distribution of the scattered light „observed” in both transmission and reflection. Moreover calculation can be done for real sample dimensions (to compare the results with the measurement of the angular distribution function using LED laser) or for a semi-infinite sample which suppresses the interference effects and thus such distribution functions can be used as an input parameter for our 3-dimensional optical model CELL for thin film silicon solar cell modeling.In the second part of this contribution we describe our experiment of thin film silicon solar cell characterization by Light Beam Induced Current (LBIC). This measurement done for laboratory solar cell structures reveals the light scattering and light trapping properties of the multilayer stack on a glass substrate. We suggest the test structure for the direct back reflector quality comparison and thus also for its optimization.


1999 ◽  
Vol 588 ◽  
Author(s):  
Charles Paulson ◽  
Brian Hawkins ◽  
Jingxi Sun ◽  
Arthur B. Ellis ◽  
Leon Mccaughan ◽  
...  

AbstractA novel Near-field Scanning Optical Microscopy (NSOM) technique is used to obtain simultaneous topology, photoluminescence and photoreflectance (PR) spectra. PR spectra from GaAs surfaces were obtained and the local electric fields were calculated. Sub-wavelength resolution is expected for this technique and achieved for PL and topology measurements. Photovoltages, resulting from the high intensity of light at the NSOM tip, can limit the spatial resolution of the electric field determination.


Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.


1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold

Sign in / Sign up

Export Citation Format

Share Document