Atomic Force Michoscxpy-Feasibility for Materials Research.

1987 ◽  
Vol 111 ◽  
Author(s):  
P. J. Bryant ◽  
R. Yang ◽  
R. Miller

AbstractThe applicability of atomic force microscopy (AFM) to both conductive and dielectric materials is the subject of this study. A representative conductor, Cu, and two dielectrics, mica and selenite, were examined. Microstructure and single lamellar steps were resolved. Surface areas on Cu and mica generated reproducible images when scanned repeatedly. There was no evidence of damage to the probe or the sample as a result of the AFM investigations. Selenite did show evidence of change after repeated scans with an AFM lever of 12 N/m spring constant exerting a 10−6N force.

2015 ◽  
Vol 6 ◽  
pp. 1183-1191 ◽  
Author(s):  
Colin A Grant ◽  
Peter C Twigg ◽  
Richard Baker ◽  
Desmond J Tobin

Tattooing has long been practised in various societies all around the world and is becoming increasingly common and widespread in the West. Tattoo ink suspensions unquestionably contain pigments composed of nanoparticles, i.e., particles of sub-100 nm dimensions. It is widely acknowledged that nanoparticles have higher levels of chemical activity than their larger particle equivalents. However, assessment of the toxicity of tattoo inks has been the subject of little research and ink manufacturers are not obliged to disclose the exact composition of their products. This study examines tattoo ink particles in two fundamental skin components at the nanometre level. We use atomic force microscopy and light microscopy to examine cryosections of tattooed skin, exploring the collagen fibril networks in the dermis that contain ink nanoparticles. Further, we culture fibroblasts in diluted tattoo ink to explore both the immediate impact of ink pigment on cell viability and also to observe the interaction between particles and the cells.


2007 ◽  
Vol 78 (9) ◽  
pp. 093705 ◽  
Author(s):  
E. D. Langlois ◽  
G. A. Shaw ◽  
J. A. Kramar ◽  
J. R. Pratt ◽  
D. C. Hurley

Author(s):  
Peter J. Cumpson ◽  
Charles A. Clifford ◽  
Jose F. Portoles ◽  
James E. Johnstone ◽  
Martin Munz

2005 ◽  
Vol 77 (4) ◽  
pp. 1192-1195 ◽  
Author(s):  
Mark A. Poggi ◽  
Andrew W. McFarland ◽  
Jonathan S. Colton ◽  
Lawrence A. Bottomley

2002 ◽  
Vol 87 (5-6) ◽  
pp. 780-783 ◽  
Author(s):  
Barry R. Bickmore ◽  
Kathryn L. Nagy ◽  
Paul E. Sandlin ◽  
Terry S. Crater

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