scholarly journals Tattoo ink nanoparticles in skin tissue and fibroblasts

2015 ◽  
Vol 6 ◽  
pp. 1183-1191 ◽  
Author(s):  
Colin A Grant ◽  
Peter C Twigg ◽  
Richard Baker ◽  
Desmond J Tobin
Keyword(s):  
Atomic Force Microscopy ◽  
Light Microscopy ◽  
Collagen Fibril ◽  
Chemical Activity ◽  
The West ◽  
Force Microscopy ◽  
Atomic Force ◽  
The World ◽  
The Subject ◽  
Tattoo Inks

Tattooing has long been practised in various societies all around the world and is becoming increasingly common and widespread in the West. Tattoo ink suspensions unquestionably contain pigments composed of nanoparticles, i.e., particles of sub-100 nm dimensions. It is widely acknowledged that nanoparticles have higher levels of chemical activity than their larger particle equivalents. However, assessment of the toxicity of tattoo inks has been the subject of little research and ink manufacturers are not obliged to disclose the exact composition of their products. This study examines tattoo ink particles in two fundamental skin components at the nanometre level. We use atomic force microscopy and light microscopy to examine cryosections of tattooed skin, exploring the collagen fibril networks in the dermis that contain ink nanoparticles. Further, we culture fibroblasts in diluted tattoo ink to explore both the immediate impact of ink pigment on cell viability and also to observe the interaction between particles and the cells.

scholarly journals Collagen fibril stiffening in osteoarthritic cartilage of human beings revealed by atomic force microscopy

2012 ◽  
Vol 20 (8) ◽  
pp. 916-922 ◽  
Author(s):  
C.-Y. Wen ◽  
C.-B. Wu ◽  
B. Tang ◽  
T. Wang ◽  
C.-H. Yan ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Collagen Fibril ◽  
Human Beings ◽  
Osteoarthritic Cartilage ◽  
Force Microscopy ◽  
Atomic Force

Investigation of Surface Grooves from Migrating Grain Boundaries

2002 ◽  
Vol 750 ◽  
Author(s):  
Nicole E. Munoz ◽  
Shelley R. Gilliss ◽  
N. Ravishankar ◽  
C. Barry Carter
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundary ◽  
Light Microscopy ◽  
Grain Boundaries ◽  
High Purity ◽  
Moving Boundary ◽  
Migration Process ◽  
Force Microscopy ◽  
Atomic Force ◽  
And Migration

ABSTRACTVisible-light microscopy (VLM) and atomic-force microscopy (AFM) were used to study the progression of grain-boundary grooving and migration in high-purity alumina (Lucalox™). Groove profiles from the same grain boundaries were revisited using AFM following successive heat-treatments. The grooves measured from migrating grain boundaries were found to have asymmetric partial-angles compared to those measured from boundaries that did not migrate during the experiment. For a moving boundary, the grain with the larger partial-angle was consistently found to grow into the grain with the smaller partial-angle. Migrating boundaries were observed to leave behind remnant thermal grooves. The observations indicate that the boundary may be bowing out during the migration process.

Atomic Force Michoscxpy-Feasibility for Materials Research.

1987 ◽  
Vol 111 ◽  
Author(s):  
P. J. Bryant ◽  
R. Yang ◽  
R. Miller
Keyword(s):  
Atomic Force Microscopy ◽  
Dielectric Materials ◽  
Spring Constant ◽  
Force Microscopy ◽  
Surface Areas ◽  
Atomic Force ◽  
Show Evidence ◽  
Materials Research ◽  
The Subject

AbstractThe applicability of atomic force microscopy (AFM) to both conductive and dielectric materials is the subject of this study. A representative conductor, Cu, and two dielectrics, mica and selenite, were examined. Microstructure and single lamellar steps were resolved. Surface areas on Cu and mica generated reproducible images when scanned repeatedly. There was no evidence of damage to the probe or the sample as a result of the AFM investigations. Selenite did show evidence of change after repeated scans with an AFM lever of 12 N/m spring constant exerting a 10−6N force.

Nanostructural analysis by atomic force microscopy followed by light microscopy on the same archival slide

2009 ◽  
Vol 72 (7) ◽  
pp. 471-481
Author(s):  
Mathias Wagner ◽  
Dirk Kaehler ◽  
Olaf Anhenn ◽  
Thomas Betz ◽  
Sally Awad ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Light Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Comparative analysis of clastogen-induced chromosome aberrations observed with light microscopy and by means of atomic force microscopy

2013 ◽  
Vol 753 (1) ◽  
pp. 29-35 ◽  
Author(s):  
Vanya Petrova Koleva ◽  
Asya Pencheva Dragoeva ◽  
Andreana Ivanova Andreeva ◽  
Marina Todorova Burova ◽  
Sevdalin Georgiev ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Analysis ◽  
Light Microscopy ◽  
Chromosome Aberrations ◽  
Force Microscopy ◽  
Atomic Force
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