Measurement of Grain Boundary Migration In Situ by Synchrotron X-Ray Topography

1988 ◽  
Vol 122 ◽  
Author(s):  
C. L. Bauer ◽  
J. Gastaldi ◽  
C. Jourdan ◽  
G. Grange
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
Grain Boundary Migration ◽  
X Ray

Investigation of Grain Boundary Migration in Situ by Synchrotron X-Ray Topography

1988 ◽  
Vol 143 ◽  
Author(s):  
C. L. Bauer ◽  
J. Gastaldi ◽  
C. Jourdan ◽  
G. Grange
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
Boundary Structure ◽  
Grain Boundary Migration ◽  
X Ray ◽  
Grain Boundary Mobility ◽  
Advantages And Disadvantages ◽  
Grain Boundary Character ◽  
Crystallographic Facets

AbstractGrain boundary migration has been investigated in prestrained monocrystalline specimens of aluminum in situ, continuously and at temperatures ranging from 415 to 610°C by synchrotron (polychromatic) x-ray topography (SXRT). In general, new (recrystallized) grains nucleate at prepositioned surface indentations and expand into the prestrained matrix, revealing complex evolution of crystallographic facets and occasional generation of (screw) dislocations in the wake of the moving boundaries. Analysis of corresponding migration rates for several faceted grain boundaries yields activation energies ranging from 56 to 125 kCal/mole, depending on grain boundary character. it is concluded that grain boundary mobility is a sensitive function of grain boundary inclination, resulting in ultimate survival of low-mobility (faceted) inclinations as a natural consequence of growth selection. Advantages and disadvantages associated with measurement of grain boundary migration by SXRT are enumerated and corresponding results are interpreted in terms of fundamental relationships between grain boundary structure and corresponding migration kinetics.

"IN SITU" SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHIC STUDY OF GRAIN BOUNDARY MIGRATION

1990 ◽  
Vol 51 (C1) ◽  
pp. C1-405-C1-414
Author(s):  
J. GASTALDI ◽  
C. JOURDAN ◽  
G. GRANGE
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
Grain Boundary Migration ◽  
X Ray ◽  
White Beam

“In situ” determination of grain boundary migration rates by synchrotron white beam X-ray topography

1988 ◽  
Vol 109 (2) ◽  
pp. 403-411 ◽  
Author(s):  
J. Gastaldi ◽  
C. Jourdan ◽  
G. Grange ◽  
C. L. Bauer
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
Grain Boundary Migration ◽  
X Ray ◽  
Migration Rates ◽  
White Beam

Mechanisms of New Orientation Formation during Recrystallization of Old Deformed Aluminium Bicrystals

2005 ◽  
Vol 495-497 ◽  
pp. 1249-1254 ◽  
Author(s):  
Henryk Paul ◽  
Julian H. Driver ◽  
Arnaud Lens
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
Grain Boundary Migration ◽  
Pure Aluminium ◽  
Local Orientation ◽  
Sample Heating ◽  
Orientation Mapping ◽  
Grain Orientations ◽  
Slip Planes

The crystallography of recrystallization nucleation has been investigated in channel-die deformed pure aluminium bicrystals with {100}<011>/{110}<001> and {100}<001>/{110}<001> orientations. The new grain orientations and misorientations were followed by systematic local orientation measurements using SEM and semi-automatic measurements in a TEM. In particular, orientation mapping combined with in-situ sample heating was used to investigate the formation and growth of new grains and their crystallographic orientation changes at very early stages of recrystallization. Grain boundary migration and ‘consumption’ of the as-deformed areas was always favoured along directions parallel to the traces of the {111} slip planes that had been most active during deformation. The orientations of the first formed nuclei were misoriented with respect to the orientations identified within the neighbouring deformed areas by α(<111>, <112>, or <100>)relations.

In situ atomistic observation of grain boundary migration subjected to defect interaction

2020 ◽  
Vol 199 ◽  
pp. 42-52 ◽  
Author(s):  
Q. Zhu ◽  
S.C. Zhao ◽  
C. Deng ◽  
X.H. An ◽  
K.X. Song ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
Grain Boundary Migration ◽  
Defect Interaction

An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature

1971 ◽  
Vol 15 ◽  
pp. 435-445
Author(s):  
Robert E. Green
Keyword(s):  
Grain Boundary ◽  
Test Specimen ◽  
Boundary Migration ◽  
Aluminum Foil ◽  
Average Diameter ◽  
Absolute Measurement ◽  
Grain Boundary Migration ◽  
X Ray ◽  
Cold Worked ◽  
Considerable Work

Considerable work has been undertaken in order to gain an understanding of the mechanisms responsible for the generation of recrystallization textures developed upon annealing of cold-worked metals. Most direct measurements have consisted of measuring the increase in average diameter of the largest grain growing into a polycrystalline aggregate. Experimental measurements of individual boundaries migrating into deformed single crystals, though of a more fundamental nature, have been made by far fewer investigators. This is probably due to the increased experimental difficulties associated with careful control of such experiments. Most previous investigators have made grain boundary migration measurements by the heat-cool-etch method, despite the fact that it has several marked disadvantages. Other investigators have constructed an X-ray goniometer furnace and used it to measure grain boundary migration rates while the test specimen was maintained at temperature. Since there have been no published reports of the use of such a system in the past thirteen years, it must be concluded that the technique was unsuccessful in general.The system described in the present work is relatively simple in design and extremely simple to use. Not only does it permit absolute measurement of grain boundary position at temperature but it also permits boundary migration measurements to be made of extremely fast moving boundaries. The basic components of the system are as follows. A continuous spectrum X-ray beam is converted by a slit collimating system into a beam which is incident along the entire length of the test specimen. This beam is interrupted by a wire grid just prior to impingement on the test specimen. The test specimen is supported vertically in a furnace maintained at the temperature required for grain boundary migration. The various diffracted X-ray beams pass out of the furnace through a highly reflecting insulating baffle made from very thin aluminum foil and impinge on a fluorescent screen. This screen converts the X-ray image into a visible one which is amplified and recorded using the electro-optical system.

Anisotropy of Grain Boundary Migration Observed in Situ by Synchrotron Radiation

2004 ◽  
Vol 467-470 ◽  
pp. 911-916 ◽  
Author(s):  
Václav Paidar ◽  
Pavel Lejček ◽  
M. Polcarová ◽  
J. Brádler ◽  
Alain Jacques
Keyword(s):  
Synchrotron Radiation ◽  
Grain Boundary ◽  
Moving Boundary ◽  
Elevated Temperatures ◽  
Rotation Axis ◽  
Boundary Migration ◽  
Crystal Defects ◽  
Grain Boundary Migration ◽  
Grain Boundary Motion

Grain boundary motion was studied in situ at elevated temperatures by x-ray topography using synchrotron radiation. In addition to the position of grain boundary, other crystal defects that may interact with the moving boundary were observed simultaneously. Two types of bicrystals with the [001] rotation axis were selected for the experiments, the first one with a high coincidence S5 misorientation of about 37° and the other one with no coincidence of two crystals for the misorientation of 45°. The geometrical differences between chosen bicrystals are examined and attention is also paid to faceting – local orientations of the boundary plane.

scholarly journals In-Situ Observation of Grain-Boundary Migration in Fe-3wt%Si Bicrystals by Synchrotron X-Radiation Topography

1996 ◽  
Vol 82 (6) ◽  
pp. 471-474 ◽  
Author(s):  
Katsushi ICHIKAWA ◽  
Toshiyuki UEDA ◽  
Sadahiro TSUREKAWA ◽  
Yasunari YOSHITOMI ◽  
Yukio MATSUO ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Boundary Migration ◽  
In Situ Observation ◽  
Grain Boundary Migration

High-temperature high-resolution in-situ microscopy of grain boundary migration and structure change

1990 ◽  
Vol 48 (4) ◽  
pp. 514-515
Author(s):  
Hideki Ichinose ◽  
Tokuji Kizuka ◽  
Yoichi Ishida
Keyword(s):  
High Temperature ◽  
High Resolution ◽  
Grain Boundary ◽  
High Stability ◽  
Boundary Migration ◽  
Structure Change ◽  
Objective Lens ◽  
Video Tape ◽  
Grain Boundary Migration

A high resolution high temperature specimen stage of 200kV HRTEM was newly designed and produced in order to investigate the physical and mechanical nature of materials at high temperature.The atomic process of silicon grain boundary migration and the structure change was successfully observed in-situ at 1000K by the new specimen stage.The high temperature specimen stage consists of a heating specimen holder, a high stability power supply and a high stability current controller. Heat is provided by an induction free double spiral coil heater which is made of tungsten. Excellent current stability, better than 10−6 , prevents the objective lens from the magnetic disturbance which is caused by heating current. The highest temperature of the specimen is designed to be 1100K. The accuracy of the temperature measurement is checked by the melting test of tin. In order to keep the high resolution of the microscope(JEM-200CX) at such high temperature as 1100K an objective lens is also newly designed and produced. Aberration constants of the new lens are respectively Cs=0.7mm and Cc=1.2mm. Resulted resolution at high temperature is as same level as the that of the original JEM-200CX at room temperature. Images are recorded by a video tape recorder.

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