An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature
Keyword(s):
1990 ◽
Vol 51
(C1)
◽
pp. C1-405-C1-414
1983 ◽
Vol 41
◽
pp. 382-383
1988 ◽
Vol 46
◽
pp. 606-607
1986 ◽
Vol 44
◽
pp. 560-561