Interfacial Structure and Lattice Mismatch in Lamellar TiAl Alloys

AbstractThe gamma lamellae in TiAI alloys are rotated relative to each other approximately by multiples of 60˚ so that close packed planes and directions nearly align. However, the deviations caused by the tetragonality of the lattice are important in determining the structure of the interfaces and the internal stresses in the lamellae. These, in turn, strongly affect the mechanical properties of the alloys. In this paper two new electron optical techniques are used to quantify the deviations from pure twist boundaries (1) selected area diffraction from two adjacent twin-related lamellae permits c/a to be measured with high precision, (2) convergent beam diffraction is used to measure tilt components of lamellar boundaries and also rotations of vectors within the lamellar boundaries. The results are discussed in connection with the weak beam observations of interface dislocation structures.

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On effects of non-systematic reflections on weak-beam images of partial dislocations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087756 ◽

1991 ◽

Vol 49 ◽

pp. 688-689

Author(s):

K. Z. Botros ◽

S. S. Sheinin

Keyword(s):

High Precision ◽

Stacking Fault ◽

Important Application ◽

Stacking Fault Energy ◽

Sharp Peak ◽

Weak Beam ◽

Partial Dislocations ◽

Deviation Parameter ◽

Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

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TEM Study of a Tilt Boundary in Hot-Pressed Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100097454 ◽

1981 ◽

Vol 39 ◽

pp. 160-161

Author(s):

C. B. Carter ◽

J. Rose ◽

D. G. Ast

Keyword(s):

Electron Diffraction ◽

Imaging Technique ◽

Interface Structure ◽

Large Area ◽

Weak Beam ◽

Lattice Fringe ◽

Electron Diffraction Technique ◽

Tilt Boundaries ◽

Beam Technique ◽

Twist Boundaries

The hot-pressing technique which has been successfully used to manufacture twist boundaries in silicon has now been used to form tilt boundaries in this material. In the present study, weak-beam imaging, lattice-fringe imaging and electron diffraction techniques have been combined to identify different features of the interface structure. The weak-beam technique gives an overall picture of the geometry of the boundary and in particular allows steps in the plane of the boundary which are normal to the dislocation lines to be identified. It also allows pockets of amorphous SiO2 remaining in the interface to be recognized. The lattice-fringe imaging technique allows the boundary plane parallel to the dislocation to be identified. Finally the electron diffraction technique allows the periodic structure of the boundary to be evaluated over a large area - this is particularly valuable when the dislocations are closely spaced - and can also provide information on the structural width of the interface.

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Relative Intensities in ED Patterns From Thin Gold Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100096436 ◽

1972 ◽

Vol 30 ◽

pp. 636-637

Author(s):

R. H. Morriss ◽

J. D. C. Peng ◽

C. D. Melvin

Keyword(s):

Theoretical Calculations ◽

Diffraction Theory ◽

Gold Films ◽

Reasonable Accuracy ◽

Experimental Conditions ◽

Crystal Perfection ◽

Heavy Atoms ◽

Fine Focus ◽

Convergent Beam ◽

Beam Diffraction

Although dynamical diffraction theory was modified for electrons by Bethe in 1928, relatively few calculations have been carried out because of computational difficulties. Even fewer attempts have been made to correlate experimental data with theoretical calculations. The experimental conditions are indeed stringent - not only is a knowledge of crystal perfection, morphology, and orientation necessary, but other factors such as specimen contamination are important and must be carefully controlled. The experimental method of fine-focus convergent-beam electron diffraction has been successfully applied by Goodman and Lehmpfuhl to single crystals of MgO containing light atoms and more recently by Lynch to single crystalline (111) gold films which contain heavy atoms. In both experiments intensity distributions were calculated using the multislice method of n-beam diffraction theory. In order to obtain reasonable accuracy Lynch found it necessary to include 139 beams in the calculations for gold with all but 43 corresponding to beams out of the [111] zone.

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Transmission Scanning Electron Microscopy and Energy Analysis with the Siemens ELMISKOP 101

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100095509 ◽

1972 ◽

Vol 30 ◽

pp. 450-451

Author(s):

H. M. Thieringer

Keyword(s):

Objective Lens ◽

Transmission Microscopy ◽

Image Recording ◽

Mode Of Operation ◽

Scanning Transmission ◽

Electron Microscopes ◽

And Performance ◽

Convergent Beam ◽

Ray Path ◽

Beam Diffraction

It has repeatedly been show that with conventional electron microscopes very fine electron probes can be produced, therefore allowing various micro-techniques such as micro recording, X-ray microanalysis and convergent beam diffraction. In this paper the function and performance of an SIEMENS ELMISKOP 101 used as a scanning transmission microscope (STEM) is described. This mode of operation has some advantages over the conventional transmission microscopy (CTEM) especially for the observation of thick specimen, in spite of somewhat longer image recording times.Fig.1 shows schematically the ray path and the additional electronics of an ELMISKOP 101 working as a STEM. With a point-cathode, and using condensor I and the objective lens as a demagnifying system, an electron probe with a half-width ob about 25 Å and a typical current of 5.10-11 amp at 100 kV can be obtained in the back focal plane of the objective lens.

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Performance and applications of a field-emission gun TEM/STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129346 ◽

1992 ◽

Vol 50 (2) ◽

pp. 942-943

Author(s):

Judith M. Brock ◽

Max T. Otten ◽

Marc. J.C. de Jong

Keyword(s):

Field Emission ◽

High Resolution Imaging ◽

High Quality ◽

Small Energy ◽

High Brightness ◽

Small Probe ◽

Resolution Imaging ◽

Convergent Beam ◽

Beam Patterns ◽

Beam Diffraction

A Field Emission Gun (FEG) on a TEM/STEM instrument provides a major improvement in performance relative to one equipped with a LaB6 emitter. The improvement is particularly notable for small-probe techniques: EDX and EELS microanalysis, convergent beam diffraction and scanning. The high brightness of the FEG (108 to 109 A/cm2srad), compared with that of LaB6 (∼106), makes it possible to achieve high probe currents (∼1 nA) in probes of about 1 nm, whilst the currents for similar probes with LaB6 are about 100 to 500x lower. Accordingly the small, high-intensity FEG probes make it possible, e.g., to analyse precipitates and monolayer amounts of segregation on grain boundaries in metals or ceramics (Fig. 1); obtain high-quality convergent beam patterns from heavily dislocated materials; reliably detect 1 nm immuno-gold labels in biological specimens; and perform EDX mapping at nm-scale resolution even in difficult specimens like biological tissue.The high brightness and small energy spread of the FEG also bring an advantage in high-resolution imaging by significantly improving both spatial and temporal coherence.

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convergent-beam diffraction from surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100125208 ◽

1987 ◽

Vol 45 ◽

pp. 30-33

Author(s):

J. A. Eades ◽

A. E. Smith ◽

D. F. Lynch

Keyword(s):

Reciprocal Lattice ◽

Three Dimensional ◽

Grazing Incidence ◽

Three Dimensions ◽

Plane Figure ◽

Transmission Electron ◽

Convergent Beam ◽

Beam Patterns ◽

Beam Diffraction

It is quite simple (in the transmission electron microscope) to obtain convergent-beam patterns from the surface of a bulk crystal. The beam is focussed onto the surface at near grazing incidence (figure 1) and if the surface is flat the appropriate pattern is obtained in the diffraction plane (figure 2). Such patterns are potentially valuable for the characterization of surfaces just as normal convergent-beam patterns are valuable for the characterization of crystals.There are, however, several important ways in which reflection diffraction from surfaces differs from the more familiar electron diffraction in transmission.GeometryIn reflection diffraction, because of the surface, it is not possible to describe the specimen as periodic in three dimensions, nor is it possible to associate diffraction with a conventional three-dimensional reciprocal lattice.

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A TEM study of the interface between organic matrix and aragonite in a biological hard tissue, nacre

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129759 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1024-1025

Author(s):

Jun Liu ◽

Katie E. Gunnison ◽

Mehmet Sarikaya ◽

Ilhan A. Aksay

Keyword(s):

Mechanical Properties ◽

Ion Beam ◽

Laminated Composite ◽

Organic Matrix ◽

Pearl Oyster ◽

Interfacial Structure ◽

Interfacial Region ◽

Thin Sections ◽

Organic Layers ◽

Transmission Electron

The interfacial structure between the organic and inorganic phases in biological hard tissues plays an important role in controlling the growth and the mechanical properties of these materials. The objective of this work was to investigate these interfaces in nacre by transmission electron microscopy. The nacreous section of several different seashells -- abalone, pearl oyster, and nautilus -- were studied. Nacre is a laminated composite material consisting of CaCO3 platelets (constituting > 90 vol.% of the overall composite) separated by a thin organic matrix. Nacre is of interest to biomimetics because of its highly ordered structure and a good combination of mechanical properties. In this study, electron transparent thin sections were prepared by a low-temperature ion-beam milling procedure and by ultramicrotomy. To reveal structures in the organic layers as well as in the interfacial region, samples were further subjected to chemical fixation and labeling, or chemical etching. All experiments were performed with a Philips 430T TEM/STEM at 300 keV with a liquid Nitrogen sample holder.

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Using crystallographic symmetry in diffraction and contrast analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154494 ◽

1989 ◽

Vol 47 ◽

pp. 504-505

Author(s):

U. Dahmen ◽

K.H. Westmacott

Keyword(s):

Electron Microscopy ◽

High Symmetry ◽

Two Phase ◽

Tem Analysis ◽

Crystallographic Symmetry ◽

The Matrix ◽

Contrast Analysis ◽

Practical Tool ◽

Convergent Beam ◽

Beam Diffraction

Despite the increased use of convergent beam diffraction, symmetry concepts in their more general form are not commonly applied as a practical tool in electron microscopy. Crystal symmetry provides an abundance of information that can be used to facilitate and improve the TEM analysis of crystalline solids. This paper draws attention to some aspects of symmetry that can be put to practical use in the analysis of structures and morphologies of two-phase materials.It has been shown that the symmetry of the matrix that relates different variants of a precipitate can be used to determine the axis of needle- or lath-shaped precipitates or the habit plane of plate-shaped precipitates. By tilting to a special high symmetry orientation of the matrix and by measuring angles between symmetry-related variants of the precipitate it is possible to find their habit from a single micrograph.

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