Charge Trapping and Degradation Properties of PZT Thin Films for MEMS
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AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).
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2014 ◽
Vol 53
(6)
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pp. 068009
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2019 ◽
Vol 1293
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pp. 012012
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2009 ◽
Vol 24
(4)
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pp. 1375-1387
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2014 ◽
Vol 53
(5S1)
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pp. 05FB14
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Fabrication of V1-x Ti x O2 thin films by metal-organic decomposition using carbon thermal reduction
2019 ◽
Vol 58
(7)
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pp. 075506
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2003 ◽
Vol 42
(Part 1, No. 9B)
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pp. 5973-5976
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