A Scanning Force Microscopy Study of Block Copolymers Containing a Conjugated Segment

1997 ◽  
Vol 488 ◽  
Author(s):  
Ph. Leclère ◽  
R. Lazzaroni ◽  
V. Parente ◽  
B. François ◽  
J. L. Brédas
Keyword(s):  
Diblock Copolymers ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Phase Detection ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Dynamics Calculations ◽  
Chain Composition ◽  
Scanning Force ◽  
Tapping Mode Afm

AbstractAtomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.

Scanning Force Microscopy Study of Ultrathin Films of Nickel-Phthalocyanine on Graphite

1998 ◽  
Vol 05 (01) ◽  
pp. 433-436 ◽  
Author(s):  
S. Santucci ◽  
S. Di Nardo ◽  
L. Lozzi ◽  
L. Ottaviano ◽  
M. Passacantando ◽  
...  
Keyword(s):  
Pyrolytic Graphite ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Ex Situ ◽  
Contact Mode ◽  
Force Microscopy ◽  
Nickel Phthalocyanine ◽  
Atomic Force ◽  
Scanning Force

Small amounts of purified nickel-phthalocyanine (Ni-PC) have been deposited at room temperature in ultrahigh vacuum onto highly oriented pyrolytic graphite, and studied "in situ" and "ex situ" (in air) with two different atomic force microscopes. The measurements have been taken on samples as prepared either subsequently annealed at 300°C. The growth mode is not uniform; the PC molecules coalesce into small submicrometric crystallites in the critical size range where the transition from the α to the β crystalline phase of phthalocyanines takes place. We show images of both α-like and β-like crystallites. A contact mode AFM image of an α-like crystallite showing intramolecular resolution is also presented.

Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope

1997 ◽  
Vol 3 (3) ◽  
pp. 203-213 ◽  
Author(s):  
J.A. DeRose ◽  
J.-P. Revel
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Scanning Force Microscopy ◽  
Image Deconvolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Scanning Force

Abstract: We have developed a method for the examination of atomic force microscopy (scanning force microscopy) tips using a high-resolution transmission electron microscope (TEM). The tips can be imaged in a nondestructive way, enabling one to observe the shape of an atomic force microscope probe in the vicinity of the apex with high resolution. We have obtained images of atomic force microscopy probes with a resolution on the order of 1 nm. The tips can be imaged repeatedly, so one can examine tips before and after use. We have found that the tip can become blunted with use, the rate of wear depending upon the sample and tip materials and the scanning conditions. We have also found that the tips easily accrue contamination. We have studied both commercially produced tips, as well as tips grown by electron beam deposition. Direct imaging in the TEM should prove useful for image deconvolution methods because one does not have to make any assumptions concerning the general shape of the tip profile.

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