MOCVD growth of GaN on flat and misoriented A-plane sapphire substrates

2001 ◽  
Vol 680 ◽  
Author(s):  
T. Someya ◽  
K. Hoshino ◽  
Y. Arakawa

ABSTRACTWe have grown high-quality GaN with smooth surface morphology on vicinal a-plane sapphire substrates by metalorganic chemical vapor deposition (MOCVD). The misorientation angles of vicinal a-plane sapphire substrates were changed systematically from 0° to 0.75°. Surface morphology and crystalline qualities are found to be very sensitive to misorientation angles of a-plane sapphire substrates and the misorientation angle was optimized to be 0.25°.

1999 ◽  
Vol 4 (S1) ◽  
pp. 634-641 ◽  
Author(s):  
M. Sumiya ◽  
T. Ohnishi ◽  
M. Tanaka ◽  
A. Ohtomo ◽  
M. Kawasaki ◽  
...  

Control of the polarity of GaN films deposited by metalorganic chemical vapor deposition was achieved by substrate nitridation and subsequent annealing of a buffer layer. The surface morphology and optical properties of 1.2μm GaN films were influenced by the different growth mode due to the polar direction. Coaxial impact collision ion scattering spectroscopy revealed that the polarity composition of a buffer layer on nitrided sapphire varied by annealing in a H2 atmosphere. It was considered that the systematic variation of the surface morphology was caused by the polarity composition of the buffer layer.


2008 ◽  
Vol 310 (23) ◽  
pp. 5166-5169 ◽  
Author(s):  
Jianping Liu ◽  
Jae-Hyun Ryou ◽  
Zachary Lochner ◽  
Jae Limb ◽  
Dongwon Yoo ◽  
...  

2011 ◽  
Vol 32 (9) ◽  
pp. 896-901 ◽  
Author(s):  
陈耀 CHEN Yao ◽  
王文新 WANG Wen-xin ◽  
黎艳 LI Yan ◽  
江洋 JIANG Yang ◽  
徐培强 XU Pei-qiang ◽  
...  

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