Short Range Order Structure Around Oxygen Atoms in the Superconductor Y-Ba-Cu-O

1987 ◽  
Vol 99 ◽  
Author(s):  
S. C. Woronick ◽  
W. Ng ◽  
A. Krol ◽  
B. X. Yang ◽  
Y. H. Kao ◽  
...  

ABSTRACTSpectra of the oxygen K-edge extended x-ray absorption fine structure (EXAFS) of the superconducting compound Y-Ba-Cu-O were obtained by measuring the total electron yield as a function of incident x-ray energy at temperatures between 77K and 300K. This technique affords a convenient way for probing the local environment around the oxygen atoms and soft modes in the lattice.

1987 ◽  
Vol 99 ◽  
Author(s):  
A. Krol ◽  
F. Xu ◽  
L. Y. Jang ◽  
C. J. Sher ◽  
S. Spagna ◽  
...  

ABSTRACTThe local structure around Ba atoms in the compound superconductor Y-Ba-Cu-O has been studied by measuring the extended x-ray absorption fine structure (EXAFS) near the Ba K edge. This technique is used to investigate the changes in the short range order structure when the system is doped with impurities.


1989 ◽  
Vol 158 (1-3) ◽  
pp. 465-466 ◽  
Author(s):  
A. Krol ◽  
L.Y. Jang ◽  
S.C. Woronick ◽  
F. Xu ◽  
Y.D. Yao ◽  
...  

Author(s):  
Anatoly Frenkel

We discuss methods of Extended X-ray Absorption Fine-Structure (EXAFS) analysis that provide three-dimensional structural characterization of metal nanoparticles, both mono- and bi-metallic. For the bimetallic alloys, we use short range order measurements to discriminate between random and non-random inter-particle distributions of atoms. We also discuss the application of EXAFS to heterogeneous nanoparticle systems.


1992 ◽  
Vol 281 ◽  
Author(s):  
T. K. Sham ◽  
D. T. Jiang ◽  
I. Coulthard ◽  
J. W. Lorimer ◽  
X. H. Feng ◽  
...  

ABSTRACTOptical luminescence in porous silicon induced by soft X-ray and vacuum UV excitation with energies in the vicinity of the Si K-edge (1838 eV) and the Si L-edge (99 eV) has been observed. The luminescence has been used, together with total electron yield, to record X-ray absorption fine structure (XAFS) in the near-edge region of both Si edges. The near- edge spectra recorded simultaneously with either luminescence or total electron yield were compared, and the implications of these measurements for the structure of porous silicon are discussed.


2014 ◽  
Vol 21 (6) ◽  
pp. 1296-1304 ◽  
Author(s):  
Debdutta Lahiri ◽  
Surinder M. Sharma ◽  
Ashok K. Verma ◽  
B. Vishwanadh ◽  
G. K. Dey ◽  
...  

Short-range order has been investigated in Zr69.5Cu12Ni11Al7.5and Zr41.5Ti41.5Ni17metallic glasses using X-ray absorption spectroscopy andab initiomolecular dynamics simulations. While both of these alloys are good glass formers, there is a difference in their glass-forming abilities (Zr41.5Ti41.5Ni17> Zr69.5Cu12Ni11Al7.5). This difference is explained by inciting the relative importance of strong chemical order, icosahedral content, cluster symmetry and configuration diversity.


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