Metal oxide semiconductor thin-film transistor backplanes for displays and imaging

MRS Bulletin ◽

10.1557/s43577-021-00228-8 ◽

2022 ◽

Author(s):

Denis Striakhilev ◽

Byung-kyu Park ◽

Shuenn-Jiun Tang

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Thin Film Transistor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Semiconductor Thin Film

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Analysis of Carrier Mobility in Amorphous Metal-Oxide Semiconductor Thin-Film Transistor using Hall Effect

IEEE Electron Device Letters ◽

10.1109/led.2020.2993268 ◽

2020 ◽

pp. 1-1

Author(s):

Kota Imanishi ◽

Tokiyoshi Matsuda ◽

Mutsumi Kimura

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Hall Effect ◽

Carrier Mobility ◽

Thin Film Transistor ◽

Amorphous Metal ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Semiconductor Thin Film ◽

Amorphous Metal Oxide

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Complementary metal-oxide-semiconductor thin-film transistor circuits from a high-temperature polycrystalline silicon process on steel foil substrates

IEEE Transactions on Electron Devices ◽

10.1109/ted.2002.804702 ◽

2002 ◽

Vol 49 (11) ◽

pp. 1993-2000 ◽

Author(s):

Ming Wu ◽

Xiang-Zheng Bo ◽

J.C. Sturm ◽

S. Wagner

Keyword(s):

Thin Film ◽

High Temperature ◽

Metal Oxide ◽

Polycrystalline Silicon ◽

Thin Film Transistor ◽

Complementary Metal Oxide Semiconductor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Transistor Circuits ◽

Semiconductor Thin Film

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Preparation and Application to Enzyme Sensor of Temperature-sensitive Metal Oxide Semiconductor Thin Film.

Journal of the Japan Society of Powder and Powder Metallurgy ◽

10.2497/jjspm.47.838 ◽

2000 ◽

Vol 47 (8) ◽

pp. 838-843

Author(s):

Yoshimitsu Yachi ◽

Shigeki Chiba ◽

Hiroshi Osada ◽

Hideo Oka ◽

Kyoshiro Seki

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Temperature Sensitive ◽

Enzyme Sensor ◽

Semiconductor Thin Film

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A Two-Layer Stacked Polycrystalline Silicon Thin Film Transistor Complementary Metal Oxide Semiconductor Inverters Using Laser Crystallized Channel with High-kand Metal Gate on Si

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.3091 ◽

2008 ◽

Vol 47 (4) ◽

pp. 3091-3094 ◽

Author(s):

Soon-Young Oh ◽

Chang-Geun Ahn ◽

Jong-Heon Yang ◽

Won-Ju Cho ◽

Moon-Gyu Jang

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Polycrystalline Silicon ◽

Thin Film Transistor ◽

Complementary Metal Oxide Semiconductor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Silicon Thin Film

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High performing metal–oxide semiconductor thin-film transistors

VLSI and Post-CMOS Electronics. Volume 1: Design, modelling and simulation ◽

10.1049/pbcs073f_ch12 ◽

2019 ◽

pp. 287-311

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Thin Film Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

High Performing ◽

Semiconductor Thin Film

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Metal Oxide Semiconductor Thin-Film Transistors: Device Physics and Compact Modeling

Outlook and Challenges of Nano Devices, Sensors, and MEMS ◽

10.1007/978-3-319-50824-5_3 ◽

2017 ◽

pp. 69-98

Author(s):

Wanling Deng ◽

Jielin Fang ◽

Xixiong Wei ◽

Fei Yu

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Thin Film Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Compact Modeling ◽

Device Physics ◽

Semiconductor Thin Film

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Determination of bulk and interface density of states in metal oxide semiconductor thin-film transistors by using capacitance–voltage characteristics

The European Physical Journal Applied Physics ◽

10.1051/epjap/2017170179 ◽

2017 ◽

Vol 80 (1) ◽

pp. 10103 ◽

Author(s):

Xixiong Wei ◽

Wanling Deng ◽

Jielin Fang ◽

Xiaoyu Ma ◽

Junkai Huang

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Density Of States ◽

Thin Film Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Capacitance Voltage ◽

Semiconductor Thin Film

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Electrical behavior of p-type PbS-based metal-oxide-semiconductor thin film transistors

Thin Solid Films ◽

10.1016/j.tsf.2010.08.092 ◽

2010 ◽

Vol 519 (1) ◽

pp. 512-516 ◽

Author(s):

I.E. Morales-Fernández ◽

M.I. Medina-Montes ◽

L.A. González ◽

B. Gnade ◽

M.A. Quevedo-López ◽

...

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Thin Film Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Electrical Behavior ◽

Semiconductor Thin Film ◽

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Electrical Characteristics of Low-Temperature Polycrystalline Silicon Complementary Metal–Oxide–Semiconductor Thin-Film Transistors with Six-Step Photomask Structure

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.061401 ◽

2011 ◽

Vol 50 (6) ◽

pp. 061401

Author(s):

Sang-Jin Lee ◽

Jae-Hoon Park ◽

Kum-Mi Oh ◽

Seok-Woo Lee ◽

Kyung-Eon Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Metal Oxide ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Complementary Metal Oxide Semiconductor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Electrical Characteristics ◽

Semiconductor Thin Film

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Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression

Japanese Journal of Applied Physics ◽

10.7567/1347-4065/ab1604 ◽

2019 ◽

Vol 58 (9) ◽

pp. 090502 ◽

Author(s):

Yukiharu Uraoka ◽

Juan Paolo Bermundo ◽

Mami N. Fujii ◽

Mutsunori Uenuma ◽

Yasuaki Ishikawa

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Thin Film Transistors ◽

Reliability Evaluation ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Semiconductor Thin Film

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