Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression

2019 ◽  
Vol 58 (9) ◽  
pp. 090502 ◽  
Author(s):  
Yukiharu Uraoka ◽  
Juan Paolo Bermundo ◽  
Mami N. Fujii ◽  
Mutsunori Uenuma ◽  
Yasuaki Ishikawa
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Reliability Evaluation ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Thin Film

Electrical behavior of p-type PbS-based metal-oxide-semiconductor thin film transistors

2010 ◽  
Vol 519 (1) ◽  
pp. 512-516 ◽  
Author(s):  
I.E. Morales-Fernández ◽  
M.I. Medina-Montes ◽  
L.A. González ◽  
B. Gnade ◽  
M.A. Quevedo-López ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Electrical Behavior ◽  
Semiconductor Thin Film ◽  
P Type

scholarly journals Metal oxide semiconductor thin-film transistors for flexible electronics

2016 ◽  
Vol 3 (2) ◽  
pp. 021303 ◽  
Author(s):  
Luisa Petti ◽  
Niko Münzenrieder ◽  
Christian Vogt ◽  
Hendrik Faber ◽  
Lars Büthe ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Flexible Electronics ◽  
Thin Film Transistors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Thin Film
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