Determination of bulk and interface density of states in metal oxide semiconductor thin-film transistors by using capacitance–voltage characteristics
2017 ◽
Vol 80
(1)
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pp. 10103
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2019 ◽
pp. 287-311
2017 ◽
pp. 69-98
2019 ◽
Vol 58
(9)
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pp. 090502
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2011 ◽
Vol 50
(6R)
◽
pp. 061401
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Keyword(s):
2016 ◽
Vol 12
(9)
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pp. 888-891
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Keyword(s):