Scanning electron microscopy and X-ray spectroscopy applied to mycelial phase of sporothrix schenckii
1975 ◽
Vol 9
(2)
◽
pp. 57-68
Keyword(s):
X Ray
◽
Scanning electron microscopy applied to the mycelial phase of Sporothrix schenckii shows a matted mycelium with conidia of a regular pattern. X-Ray microanalysis applied in energy dispersive spectroscopy and also in wavelength dispersive spectroscopy reveals the presence of several elements of Mendeleef's classification.
2017 ◽
Vol 931
◽
pp. 012008
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2010 ◽
Vol 54
(4)
◽
pp. 633-650
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2011 ◽
Vol 243-249
◽
pp. 4687-4690
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2011 ◽
Vol 94
(8)
◽
pp. 2663-2670
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2014 ◽
Vol 802
◽
pp. 377-382
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1992 ◽
Vol 70
(5)
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pp. 469-473
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2019 ◽
Vol 20
(2)
◽
pp. 79
1991 ◽
Vol 2
(1)
◽
pp. 97-106