On a New Method for the Rapid Determination of the Strength of Industrial Emissions of a Pollutant

2019 ◽  
Vol 23 (12) ◽  
pp. 34-37
Author(s):  
N.N. Roeva ◽  
S.S. Voronich ◽  
D.A. Zaitsev ◽  
N.S. Voronich ◽  
A.G. Chernobrovina
Keyword(s):  
Industrial Ecology ◽  
Environmental Control ◽  
Rapid Determination ◽  
Pollutant Emissions ◽  
Pollutant Emission ◽  
Quantitative Chemical Analysis ◽  
Industrial Emissions ◽  
Public Authorities ◽  
Inverse Dispersion

A method has been developed for the operational determination of the strength of industrial emissions of a pollutant by an APS without direct measurements of concentrations and parameters in it, which relates to industrial ecology and can be used in the state environmental control or monitoring system to increase its effectiveness and responsiveness. The essence of the method is to use the information provided by public authorities. An information base is being created for all organized APS located in the observed urbanized area, which contains information about the sources of pollutant emissions and their characteristics; establishes the fact of unauthorized pollutant release by detecting elevated concentrations of various pollutants in the observed area according to the results of quantitative chemical analysis of atmospheric air samples and determines their ratio; the inverse dispersion problem is solved and the area of the location of sources of unauthorized pollutant emissions is identified, the source of unauthorized pollutant emissions is determined, and then the strength of this pollutant emission is estimated (Mi, g/s).

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis
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