Defect Recognition In Regularly Patterned Substrates Using Optical Fourier Transform Techniques Final Report CRADA No. TSB-1164-95
1972 ◽
Vol 11
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pp. 1425
2000 ◽
Vol 39
(35)
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pp. 6573
Pierre M. Lane
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Michael Cada
Santiago Tainta
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Maria J. Erro
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Maria J. Garde
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Waldimar Amaya
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Salvador Sales
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...
J.A. Bullin
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W.J. Rogers
1989 ◽
Vol 38
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pp. 1723
CHEN YAN-SONG
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ZHENG SHI-HAI
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MA XUE-BING
2012 ◽
Vol 49
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pp. 08006-08006
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Edgar Flores
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Faraz Idrees
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Philippe Moussay
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Joële Viallon
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Robert Wielgosz
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...
2013 ◽
Vol 21
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pp. 5063
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Yongfeng Gao
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Liangcai Cao
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Zheng You
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Jiahao Zhao
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Zichen Zhang
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...
H. W. Siesler
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G. G. Hoffmann
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O. Kolomiets
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F. Pfeifer
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M. Zahedi