scholarly journals Аморфизация кремниевых нанонитей при облучении ионами аргона

2022 ◽  
Vol 48 (2) ◽  
pp. 11
Author(s):  
А.В. Кононина ◽  
Ю.В. Балакшин ◽  
К.А. Гончар ◽  
И.В. Божьев ◽  
А.А. Шемухин ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Porous Silicon ◽  
Silicon Nanowires ◽  
Ion Irradiation ◽  
Silicon Thin Films ◽  
Thin Silicon

The irradiation of silicon nanowires with Ar+ ions with an energy of 250 keV and fluences from 1013 cm^-2 to 10^16 cm^-2 was carried out. The dependence of the destruction of the structure under the action of ion irradiation on the fluence is investigated by the Raman spectroscopy. It is shown that the amorphization of porous silicon occurs at higher dpa values than in thin silicon thin films.

Temperature dependence of the transient and AC electrical conductivity of porous silicon thin films

2003 ◽  
Vol 101 (1-3) ◽  
pp. 334-337 ◽  
Author(s):  
M. Theodoropoulou ◽  
C.A. Krontiras ◽  
N. Xanthopoulos ◽  
S.N. Georga ◽  
M.N. Pisanias ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Porous Silicon ◽  
Temperature Dependence ◽  
Ac Electrical Conductivity ◽  
Silicon Thin Films

Porous silicon thin films as anodes for lithium ion batteries deposited by co-evaporation of silicon and zinc

2019 ◽  
Vol 358 ◽  
pp. 586-593 ◽  
Author(s):  
Stefan Saager ◽  
Bert Scheffel ◽  
Olaf Zywitzki ◽  
Thomas Modes ◽  
Markus Piwko ◽  
...  
Keyword(s):  
Thin Films ◽  
Porous Silicon ◽  
Lithium Ion Batteries ◽  
Lithium Ion ◽  
Silicon Thin Films

In situ study of porous silicon thin films thermal oxidation by pulsed laser photoacoustics

2018 ◽  
Vol 33 (8) ◽  
pp. 085001
Author(s):  
Atzin David Ruíz Pérez ◽  
M B de la Mora ◽  
J L Benítez ◽  
R Castañeda-Guzmán ◽  
Jorge Alejandro Reyes-Esqueda ◽  
...  
Keyword(s):  
Thin Films ◽  
Porous Silicon ◽  
Thermal Oxidation ◽  
Pulsed Laser ◽  
In Situ Study ◽  
Silicon Thin Films

Characterization of Defects in Polycrystalline Silicon Thin Films Using Chemical Etching, Hydrogenation, and Raman Spectroscopy

2008 ◽  
Vol 47 (1) ◽  
pp. 54-58 ◽  
Author(s):  
Kuninori Kitahara ◽  
Hiroya Ogasawara ◽  
Junji Kambara ◽  
Mitsunori Kobata ◽  
Yasutaka Ohashi
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Chemical Etching ◽  
Polycrystalline Silicon ◽  
Silicon Thin Films

Low temperature N2-based passivation technique for porous silicon thin films

2009 ◽  
Vol 149 (33-34) ◽  
pp. 1322-1325 ◽  
Author(s):  
T.D. James ◽  
A. Keating ◽  
G. Parish ◽  
C.A. Musca
Keyword(s):  
Thin Films ◽  
Porous Silicon ◽  
Low Temperature ◽  
Silicon Thin Films

Photoluminescence and Raman spectroscopy of silicon thin films grown by laser ablation

2020 ◽  
Vol 102 ◽  
pp. 109813 ◽  
Author(s):  
J.R. Aguilar-Hernández ◽  
J. Sastré-Hernández ◽  
G. Monroy-Rodríguez ◽  
M.A. Hernández-Pérez
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Laser Ablation ◽  
Silicon Thin Films
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