scholarly journals Construction of Low-loss Sapphire Resonators for Precise Measurements of the Microwave Surface Resistance of High Tc Superconducting Thin Films.

2002 ◽  
Vol 37 (2) ◽  
pp. 54-60
Author(s):  
Kazunori KOMORI ◽  
Kyoko KAWAGISHI ◽  
Masao FUKUTOMI ◽  
Kazumasa TOGANO
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Superconducting Thin Films ◽  
Microwave Surface Resistance ◽  
Low Loss ◽  
High Tc

Mirror-image calibrator for resonant perturbation method in surface resistance measurements of high Tc superconducting thin films

1999 ◽  
Vol 70 (7) ◽  
pp. 3092-3096 ◽  
Author(s):  
C. K. Ong ◽  
Linfeng Chen ◽  
Jian Lu ◽  
S. Y. Xu ◽  
Xuesong Rao ◽  
...  
Keyword(s):  
Thin Films ◽  
Perturbation Method ◽  
Surface Resistance ◽  
Mirror Image ◽  
Superconducting Thin Films ◽  
High Tc

Measurement of microwave surface resistance of patterned superconducting thin films

1990 ◽  
Vol 19 (1) ◽  
pp. 117-121 ◽  
Author(s):  
D. Kalokitis ◽  
A. Fathy ◽  
V. Pendrick ◽  
R. Brown ◽  
B. Brycki ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Superconducting Thin Films ◽  
Microwave Surface Resistance

PREPARATION OF BUFFER LAYERS ON SAPPHIRE FOR HIGH Tc SUPERCONDUCTING THIN FILMS

1991 ◽  
Vol 05 (19) ◽  
pp. 1267-1273 ◽  
Author(s):  
X. D. WU ◽  
R. E. MUENCHAUSEN
Keyword(s):  
Thin Films ◽  
High Frequency ◽  
Dielectric Constants ◽  
Buffer Layers ◽  
Processing Temperature ◽  
Superconducting Thin Films ◽  
Superconducting Properties ◽  
Stabilized Zirconia ◽  
Low Loss ◽  
High Tc

Sapphire is a preferred substrate for high frequency applications where small dielectric constants and low loss tangents are required. It is also much cheaper than other oxide subsrates such as SrTiO 3, LaAlO 3, NdGaO 3, MgO, and yttria-stabilized zirconia (YSZ) for high T c superconducting thin films. Unfortunately, sapphire is not chemically compatible with the high T c superconductors at the processing temperature required to obtained good superconducting properties. As a result, an appropriate buffer layer on sapphire is required.

Measurement method of microwave surface resistance of high Tc superconductive thin films

2003 ◽  
Vol 385 (4) ◽  
pp. 473-476 ◽  
Author(s):  
Yingmin Zhang ◽  
Zhengxiang Luo ◽  
Kai Yang ◽  
Qishao Zhang
Keyword(s):  
Thin Films ◽  
Measurement Method ◽  
Surface Resistance ◽  
Microwave Surface Resistance ◽  
High Tc

Microwave surface resistance in Tl‐based superconducting thin films

1989 ◽  
Vol 55 (13) ◽  
pp. 1357-1359 ◽  
Author(s):  
L. D. Chang ◽  
M. J. Moskowitz ◽  
R. B. Hammond ◽  
M. M. Eddy ◽  
W. L. Olson ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Superconducting Thin Films ◽  
Microwave Surface Resistance
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