Application of Scanning Electron Microscopy and Focused Ion Beam in the Particle Accelerator at CERN – Case study on Laser Engineering of Surface Structure for Secondary Electron Yield Reduction

2021 ◽  
Author(s):  
Adrienn Baris ◽  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Secondary Electron ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Particle Accelerator ◽  
Yield Reduction ◽  
Laser Engineering ◽  
Scanning Electron

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

Langmuir ◽  
2020 ◽  
Vol 36 (11) ◽  
pp. 2816-2822 ◽  
Author(s):  
Takashi Kakubo ◽  
Katsunori Shimizu ◽  
Akemi Kumagai ◽  
Hiroaki Matsumoto ◽  
Miki Tsuchiya ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Polymer Interface ◽  
Metal Polymer ◽  
Scanning Electron

Focused ion beam scanning electron microscopy in biology

2014 ◽  
Vol 254 (3) ◽  
pp. 109-114 ◽  
Author(s):  
C. KIZILYAPRAK ◽  
J. DARASPE ◽  
B.M. HUMBEL
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron

scholarly journals Correlative In Vivo 2 Photon and Focused Ion Beam Scanning Electron Microscopy of Cortical Neurons

PLoS ONE ◽  
2013 ◽  
Vol 8 (2) ◽  
pp. e57405 ◽  
Author(s):  
Bohumil Maco ◽  
Anthony Holtmaat ◽  
Marco Cantoni ◽  
Anna Kreshuk ◽  
Christoph N. Straehle ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cortical Neurons ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron

scholarly journals AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Julian Hennies ◽  
José Miguel Serra Lleti ◽  
Nicole L. Schieber ◽  
Rachel M. Templin ◽  
Anna M. Steyer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Scanning Electron Microscopy Image ◽  
Beam Scanning ◽  
Electron Microscopy Image ◽  
Microscopy Image ◽  
Scanning Electron

Degradation profiles in aged EPDM water seals using focused ion beam-scanning electron microscopy

2013 ◽  
Vol 98 (12) ◽  
pp. 2489-2496 ◽  
Author(s):  
Yoshito Ohtake ◽  
Yoshimasa Yamamoto ◽  
Mio Gonokami ◽  
Tsutomu Nakamura ◽  
Hiroyuki Ishii ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron
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