The Characterisation of Diesel Internal Injector Deposits by Focused Ion-Beam Scanning Electron Microscopy (FIB-SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy and Raman Spectroscopy.

2015 ◽  
Author(s):  
J Barker ◽  
Jacqueline Reid ◽  
M Piggott ◽  
Mike W. Fay ◽  
A Davies ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Scanning Electron

scholarly journals Plugging A Small Hole

1997 ◽  
Vol 5 (1) ◽  
pp. 3-4
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Nuclear Pore ◽  
Nuclear Pores ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
A Cell ◽  
Scanning Electron

It has long been appreciated that communication between the nucleus and the cytoplasm of a cell occurs through the nuclear pores. Regulation of this communication has remained a mystery. A breakthrough in our understanding of this regulation was recently presented by Carmen Perez- Terzic, Jason Pyle, Marisa Jaconi, Lisa Stehnc-Bittel, and David Clapham of Mayo Clinic. Using field emission scanning electron microscopy (FESEM), transmission electron microscopy, and atomic force microscopy (AFM), they demonstrated the presence of a small plug within the nuclear pore that was present under certain physiologic circumstances. This “plug“ may regulate the movement of molecules through the pore.

AFM Integrated with SEM and FIB: A Synergistic Union

2013 ◽  
Vol 21 (6) ◽  
pp. 26-31
Author(s):  
Aaron Lewis ◽  
A. Komissar ◽  
A. Ignatov ◽  
Oleg Fedoroyov ◽  
E. Maayan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Research And Development ◽  
Scientific Community ◽  
Ion Beam ◽  
Basic Research ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Electron

Scanning electron microscopy (SEM) and ion beam milling techniques are mature nanoscale measurement technologies, whereas atomic force microscopy (AFM) is a developing technology generating intense interest in the scientific community for basic research and development. These techniques have generally existed in separate worlds. This article discusses a capability that marries these technologies through an instrument recently introduced by Nanonics, the 3TB4000.

Sign in / Sign up

Export Citation Format

Share Document