Response Burden, Sample Rotation, and Classification Renewal in Economic Surveys

1977 ◽  
Vol 45 (3) ◽  
pp. 209 ◽  
Author(s):  
A. B. Sunter
Keyword(s):  
Sample Rotation ◽  
Response Burden

Examining Response Categories: Does Minimizing Response Burden Maintain the Instrument?

2013 ◽  
Author(s):  
Anneliese C. Bolland ◽  
John M. Bolland ◽  
Sara E. Tomek ◽  
Heather M. Moore
Keyword(s):  
Response Burden

3D Observation of Elemental Distribution of Si-Device using a Dedicated FIB/STEM System

2005 ◽  
Author(s):  
T. Yaguchi ◽  
M. Konno ◽  
T. Kamino ◽  
M. Ogasawara ◽  
K. Kaji ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Elemental Distribution ◽  
Multivariate Statistical ◽  
X Ray ◽  
Sample Rotation ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Elemental Maps

Abstract A technique for preparation of a pillar shaped sample and its multi-directional observation of the sample using a focused ion beam (FIB) / scanning transmission electron microscopy (STEM) system has been developed. The system employs an FIB/STEM compatible sample rotation holder with a specially designed rotation mechanism, which allows the sample to be rotated 360 degrees [1-3]. This technique was used for the three dimensional (3D) elemental mapping of a contact plug of a Si device in 90 nm technology. A specimen containing a contact plug was shaped to a pillar sample with a cross section of 200 nm x 200 nm and a 5 um length. Elemental analysis was performed with a 200 kV HD-2300 STEM equipped with the EDAX genesis Energy dispersive X-ray spectroscopy (EDX) system. Spectrum imaging combined with multivariate statistical analysis (MSA) [4, 5] was used to enhance the weak X-ray signals of the doped area, which contain a low concentration of As-K. The distributions of elements, especially the dopant As, were successfully enhanced by MSA. The elemental maps were .. reconstructed from the maps.

Raman Spectra of Solid (NH4)2CrO4 and (ND4)2CrO4 Obtained by a Rotating Cell Technique

1976 ◽  
Vol 30 (2) ◽  
pp. 187-190 ◽  
Author(s):  
Robert L. Carter ◽  
L. Kevin O'Hare
Keyword(s):  
Hydrogen Bonding ◽  
Alkali Metal ◽  
Raman Spectra ◽  
Sampling Technique ◽  
Solid Sampling ◽  
Monoclinic Structure ◽  
Ammonium Ions ◽  
Cylindrical Cell ◽  
Sample Rotation ◽  
Rotation Technique

The Raman spectra of polycrystalline (NH4)2CrO4 and (ND4)2CrO4 have been obtained by a sample rotation technique where the uncompressed solid is contained in a glass cylindrical cell. The apparatus is a commerically available sample rotator for liquids, which was modified for the described solid sampling technique. The Raman spectra of (NH4)2CrO4 and (ND4)2CrO4 are discussed in relation to their uniquely monoclinic structure, in contrast to the β-K2SO4 structure found for (NH4)2SO4 and many alkali metal chromates and sulfates. The hydrogen bonding in (NH4)2CrO4 is described, and its role in determining both the structure and the Raman spectra is discussed. The data suggest a barrier to NH4+ rotation of approximately 3.70 kcal/mol, indicating that the ammonium ions are not freely rotating on the time scale of the Raman experiment (10−13 sec).

Differential reflectance spectroscopy using sample rotation

1999 ◽  
Vol 70 (3) ◽  
pp. 1798-1800
Author(s):  
F. X. Zha ◽  
S. C. Shen ◽  
X. L. Huang ◽  
G. L. Shi
Keyword(s):  
Reflectance Spectroscopy ◽  
Sample Rotation

Compact and Efficient HFCVD for Electronic Grade Diamond and Related Materials

2009 ◽  
Vol 1203 ◽  
Author(s):  
R. Vispute ◽  
Andrew Seiser ◽  
Geun Lee ◽  
Jaurette Dozier ◽  
Jeremy Feldman ◽  
...  
Keyword(s):  
Diamond Film ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Deposition Efficiency ◽  
Raman Shift ◽  
Compositional Variation ◽  
Force Microscopy ◽  
Substrate Rotation ◽  
Sample Rotation ◽  
Hot Filament

AbstractA compact and efficient hot filament chemical vapor deposition system has been designed for growing electronic-grade diamond and related materials. We report here the effect of substrate rotation on quality and uniformity of HFCVD diamond films on 2” wafers, using two to three filaments with power ranging from 500 to 600 Watt. Diamond films have been characterized using x-ray diffraction, Raman Spectroscopy, scanning electron microscopy and atomic force microscopy. Our results indicate that substrate rotation not only yields uniform films across the wafer, but crystallites grow larger than without sample rotation. Well-faceted microcrystals are observed for wafers rotated at 10 rpm. We also find that the Raman spectrum taken from various locations indicate no compositional variation in the diamond film and no significant Raman shift associated with intrinsic stresses. Results are discussed in the context of growth uniformity of diamond film to improve deposition efficiency for wafer-based electronic applications.

Study on Coarse Aggregate Gradation Analysis of Cement Treated Base Course Based on Core Sample Image

2011 ◽  
Vol 320 ◽  
pp. 445-449
Author(s):  
Li Qun Hu ◽  
Chao Fan Wang
Keyword(s):  
Coarse Aggregate ◽  
Core Sample ◽  
Morphological Operations ◽  
Threshold Method ◽  
Aggregate Gradation ◽  
Aggregate Particle ◽  
Sample Rotation ◽  
Passing Rate ◽  
Base Course ◽  
Good Quality Image

In order to get the coarse aggregate particle gradation of cement treated base course core sample dilled form the pavement, an image acquisition system is designed. The system mainly contains an Aviiva ® M2 CL line scan camera, a core sample rotation platform and a LED light source. The software are designed and implemented by using the Matrox Mil controls in the Visual Studio VB.NET. Test results show that when the camera exposure time is set to 800μs, good quality image of core sample can be obtained. In the study, the original core sample images of cement treated aggregate were improved by rescaling of each pixel, then were binarized by using adaptive threshold method. After getting the binary image, morphological operations were carried out to deal with the conglutinations of the particles. Next, characteristics of each particle, such as area, perimeter, fitting ellipse and minFeret were extracted to calculate the area passing rate of aggregate with different size. Results shows that, in this way, the gradation of coarse aggregate (>2.36mm) can be got and the method helps to get the coarse aggregate particle distribution of cement treated aggregate core sample quickly.

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