scholarly journals Relation of Size Distribution of Cracks in Superconducting Layer to Critical Current Distribution under Small Voltage Probe Spacing in REBCO-Superconducting Composite Tape

2020 ◽  
Vol 61 (1) ◽  
pp. 213-220 ◽  
Author(s):  
Shojiro Ochiai ◽  
Hiroshi Okuda
Keyword(s):  
Size Distribution ◽  
Critical Current ◽  
Current Distribution ◽  
Superconducting Layer ◽  
Composite Tape ◽  
Voltage Probe ◽  
Small Voltage ◽  
Probe Spacing

A Monte Carlo simulation on critical current distribution of bent-damaged multifilamentary Bi2223 composite tape

2011 ◽  
Vol 471 (21-22) ◽  
pp. 1114-1118 ◽  
Author(s):  
S. Ochiai ◽  
H. Okuda ◽  
M. Fujimoto ◽  
J.K. Shin ◽  
S.S. Oh ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Critical Current ◽  
Current Distribution ◽  
Composite Tape

Modeling analysis of distribution of irreversible bending strain for critical current in Bi2223-composite tape

2008 ◽  
Vol 468 (15-20) ◽  
pp. 1796-1800 ◽  
Author(s):  
S. Ochiai ◽  
J.K. Shin ◽  
Y. Mukai ◽  
H. Matsubayashi ◽  
H. Okuda ◽  
...  
Keyword(s):  
Critical Current ◽  
Composite Tape ◽  
Bending Strain ◽  
Modeling Analysis

TRANSPORT CHARACTERISTICS IN c-AXIS La2-xSrxCuO4 (LSCO) SINGLE CRYSTALS

2005 ◽  
Vol 19 (01n03) ◽  
pp. 447-450
Author(s):  
SANG-JAE KIM ◽  
TAKESHI HATANO
Keyword(s):  
Temperature Dependence ◽  
Single Crystals ◽  
Critical Current ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Etching Method ◽  
First Time ◽  
Small Voltage

c-axis micro-bridges of La 2-x Sr x CuO 4 ( LSCO ) single crystals were fabricated by the focused-ion-beam (FIB) etching method. Small rectangular LSCO pieces were fabricated by cutting and grinding single crystals of underdoped LSCO of x=0.09. The size of LSCO single crystals between electrodes was cut to 20×40μm2 in ab-plane by using the FIB etching method. Superconductor-insulator-superconductor (SIS) like-branch structures on I-V curves of the LSCO stacks were observed for the first time. The branch structures exhibited voltage jumps of several tens mV in the range of from 1.7 K to 5 K with temperature dependence. When the temperature is changed from 5 K to 1.7 K , the critical current and the next branch split into a few of small voltage jumps with the intervals of several mV in the range of from 0.1 mV and 2.0 mV .

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