Direct-patterning of silicon carbide by nanosphere-assisted pulsed laser

Author(s):  
Arvind Battula ◽  
Senthil Theppakuttai ◽  
Shaochen Chen
2021 ◽  
Vol 9 (2) ◽  
pp. 46-50
Author(s):  
Muhanad A. Ahmed ◽  
Mohammed F. Mohammed Sabri ◽  
Wathiq R. Abed

In this paper, nanostructured silicon carbide (SiC) thin films are deposited onto glass substrate using pulsed laser deposition technique. Electrical and optical characterizations such as conductivity, resistivity, transmission, Seeback effect, absorption, absorption coefficient, energy band gap, and extinction coefficient as a function of photon energy, and the effect of thin films thickness on transmission are carried out to characterize the prepared samples. Results showed that the prepared SiC thin film is an n-type semiconductor with an indirect bandgap of ~3 eV, 448 nm cutoff wavelength, 3.4395 × 104 cm−1 absorption coefficient and 0.154 extinction coefficient. The surface morphology of the SiC thin films is studied using scanning electron microscope at a substrate temperature of 400 °C and it is found that the grain size of the prepared SiC thin film is about 30 nm. As such, the nano thin films optical and structural characteristics enable the films to be used as gases sensors in many optoelectronic devices such as the environment and ultraviolet photodiode.


1998 ◽  
Vol 332 (1-2) ◽  
pp. 290-294 ◽  
Author(s):  
Fortunato Neri ◽  
Sebastiano Trusso ◽  
Cirino Vasi ◽  
Francesco Barreca ◽  
Paolo Valisa

2017 ◽  
Vol 123 (4) ◽  
Author(s):  
Jun Zhu ◽  
Shan Hu ◽  
Wei Wang ◽  
Wei-wei Xia ◽  
Hai-tao Chen ◽  
...  

2004 ◽  
Vol 818 ◽  
Author(s):  
H. Kawasaki ◽  
Y. Suda ◽  
T. Ohshima ◽  
T. Ueda ◽  
S. Nakashima

AbstractWe have developed a new pulsed laser deposition technique using two Nd:YAG laser beams for the nucleation of silicon carbide (SiC) crystalline nano-particles and single crystalline SiC thin films. Transmission electron microscopy and atomic force microscopy observation suggest that several nanometer size SiC particles can be prepared by the new pulsed laser deposition (PLD) method using two Nd:YAG laser beams (1064nm and 532nm). X ray photoelectron spectroscopy measurements suggest that the silicon/carbon composition ratio of the prepared SiC thin films can be controlled by laser fluence and wavelength.


1996 ◽  
Vol 106 ◽  
pp. 193-197 ◽  
Author(s):  
G. De Cesare ◽  
S. La Monica ◽  
G. Maiello ◽  
G. Masini ◽  
E. Proverbio ◽  
...  

1994 ◽  
Vol 65 (17) ◽  
pp. 2171-2173 ◽  
Author(s):  
L. Rimai ◽  
R. Ager ◽  
W. H. Weber ◽  
J. Hangas ◽  
B. D. Poindexter

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