Application of Atomic Force Microscopy (AFM) in the Diagnosing of a Surface Layer

2007 ◽  
Vol 22 (1) ◽  
Author(s):  
Mirosław Bramowicz ◽  
Sylwester Kłysz
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Layer ◽  
Force Microscopy ◽  
Atomic Force

Application of Atomic-Force Microscopy for Nanoindentation of the Surface Layer of Filled Polymer Films

2019 ◽  
Vol 62 (8) ◽  
pp. 681-685 ◽  
Author(s):  
T. R. Aslamazova ◽  
V. I. Zolotarevskii ◽  
V. A. Kotenev ◽  
A. Yu. Tsivadze
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Layer ◽  
Polymer Films ◽  
Filled Polymer ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Визуализация проводящих каналов в полимерных слоях методом атомно-силовой микроскопии с проводящим зондом

2021 ◽  
Vol 91 (10) ◽  
pp. 1560
Author(s):  
В.М. Корнилов ◽  
А.Н. Лачинов ◽  
А.Р. Юсупов
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscopy ◽  
Surface Layer ◽  
Supramolecular Structure ◽  
Current Flow ◽  
Electrophysical Properties ◽  
Current Image ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ultrathin Polymer Films

The results of an experimental study of the local electrophysical properties of ultrathin polymer films by atomic force microscopy with a conducting probe are presented. It is established that visualization of current flow sites (conducting channels) is possible in areas from which the surface layer has been mechanically removed. The conducting channels in the current image have the form of individual points with a height corresponding to the locally flowing current. It is found that the location of the observed channels correlates well with the model of conductivity along the grain boundaries of the supramolecular structure of the polymer.

Material Analysis by Ultrasonic Atomic Force Microscopy

2000 ◽  
Vol 627 ◽  
Author(s):  
Chiaki Miyasaka ◽  
Lily Jia ◽  
Bernhard R. Tittmann
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Layer ◽  
Diagnostic Tool ◽  
Ceramic Powders ◽  
Detailed Structure ◽  
Force Microscopy ◽  
Nano Indentation ◽  
Atomic Force ◽  
Good Contrast ◽  
Spray Dried

ABSTRACTSpray-dried ceramic powders (e.g., Al2O3) are composed of a plurality of granules, each of which, includes ceramic particles and organic binders. It is assumed that the binders become concentrated in the surface layer of the granule in accordance with its type or its volume mixed into a ceramic portion of the granule. However, evidence to prove the assumption was limited because conventional microscopes were not able to clearly visualize the segregation. This paper presents a technique for imaging detailed structure of the spray-dried ceramic powders with the ultrasonic-atomic force microscope (U-AFM). The distribution of binder vis-a-vis Al2O3 particles is highly resolved with good contrast. The distribution was confirmed by nano -indentation. Thus, the U-AFM is shown to be a useful diagnostic tool for the development of approaches to spray-dried process evaluation.

scholarly journals Classification of hyper-variable Corynebacterium glutamicum surface-layer proteins by sequence analyses and atomic force microscopy

2004 ◽  
Vol 112 (1-2) ◽  
pp. 177-193 ◽  
Author(s):  
Nicole Hansmeier ◽  
Frank W Bartels ◽  
Robert Ros ◽  
Dario Anselmetti ◽  
Andreas Tauch ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Layer ◽  
Corynebacterium Glutamicum ◽  
Sequence Analyses ◽  
Force Microscopy ◽  
Surface Layer Proteins ◽  
Atomic Force

Application of atomic force microscopy for nanoindentation of the surface layer of filled polymer films

2019 ◽  
pp. 20-23
Author(s):  
T. R. Aslamazova ◽  
Viktor I. Zolotarevskii ◽  
Vladimir A. Kotenev ◽  
Aslan Y. Tsivadze
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Layer ◽  
Polymer Films ◽  
Filled Polymer ◽  
Force Microscopy ◽  
Atomic Force
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