scholarly journals Pengaruh Variasi Tegangan Tabung Sinar-X terhadap Signal to Noise Ratio (SNR) dengan Penerapan Anode Heel Effect menggunakan Stepwedge

2020 ◽  
Vol 22 (1) ◽  
pp. 20
Author(s):  
Puja Satwika Luh Gede ◽  
Ni Nyoman Ratini ◽  
Maghfirotul Iffah
Keyword(s):  
Signal To Noise Ratio ◽  
Test Results ◽  
Signal To Noise ◽  
Tube Voltage ◽  
X Ray ◽  
Voltage Variation ◽  
Regression Test ◽  
Noise Ratio ◽  
Heel Effect ◽  
Simple Regression

It has been conducted research to determine the effect of X-ray tube voltage variation (kV) on Signal to Noise Ratio (SNR) values by applying the Anode Heel Effect using stepwedge with the addition of 1.5 mm thickness each step. The stepwedge used was 1.5-31.5 mm. The X-ray tube voltage variations used were 40, 50, 60, 70, 80, and 90 kV. Analysis of the effect of X-ray tube voltage variation on SNR values is determined using IMB SPSS Statistics 26 with a simple regression test. The test results showed that variations in X-ray tube voltage affect SNR values, where the greater the variation in X-ray tube voltage then the SNR value would get smaller. The optimal SNR value of 72.685 was obtained at a tube tension of 40 kV and a stepwedge thickness of 27.0 mm.

Cancellation method to improve signal to noise ratio of an electrodeless microwave-biased ZnO single crystal x-ray detector

2022 ◽  
Vol 93 (1) ◽  
pp. 015006
Author(s):  
Xiaolong Zhao ◽  
Ming Ye ◽  
Zhi Cao ◽  
Danyang Huang ◽  
Tingting Fan ◽  
...  
Keyword(s):  
Single Crystal ◽  
Signal To Noise Ratio ◽  
Signal To Noise ◽  
X Ray ◽  
Noise Ratio ◽  
Zno Single Crystal

scholarly journals Erratum: “Signal-to-noise ratio in x-ray dark-field imaging using a grating interferometer” [J. Appl. Phys. 110, 053105 (2011)]

2011 ◽  
Vol 110 (10) ◽  
pp. 109902 ◽  
Author(s):  
Michael Chabior ◽  
Tilman Donath ◽  
Christian David ◽  
Manfred Schuster ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Signal To Noise Ratio ◽  
Dark Field ◽  
Signal To Noise ◽  
X Ray ◽  
Dark Field Imaging ◽  
Grating Interferometer ◽  
Noise Ratio ◽  
Field Imaging

scholarly journals Anode heel effect application with step wedge against effect of signal to noise ratio in computed radiography

2020 ◽  
Vol 4 (3) ◽  
pp. 75-82
Author(s):  
Ni Nyoman Ratini ◽  
I Made Yuliara ◽  
Windaryoto Windaryoto
Keyword(s):  
Computed Radiography ◽  
Signal To Noise Ratio ◽  
Pearson Correlation ◽  
P Value ◽  
Signal To Noise ◽  
Correlation Test ◽  
Pearson Correlation Test ◽  
R Value ◽  
Noise Ratio ◽  
Heel Effect

It was researched on the application of Anoda Heel Effect (AHE) with a step wedge on the effect of Signal To Noise Ratio (SNR) on Computed Radiography (CR) has been carried out. This research was conducted on a 21 step wedge with two treatments, namely the application of AHE and without the application of AHE. This measurement is repeated three times on radiographs to obtain a total image of six images (without the application of AHE as many as three images and with the application of AHE as many as three images). The results of taking radiographs using AHE and without AHE were measured using the RadiAnt Dicom Viewer program. The SNR value on the step wedge image without the AHE application has an average of 26.89. The SNR value on the step wedge image using AHE is 60.54. The results of the correlation test (Pearson correlation test) on the SNR showed that there was a significant and very strong effect of the application of AHE on the step wedge on the SNR in CR (p-value <0.001 and the R-value ranging from 0.600 to 0.799).

Optical gain signal-to-noise ratio transfer efficiency as an index for ranking of phosphor- photodetector combinations used in X-ray medical imaging

2004 ◽  
Vol 78 (6) ◽  
pp. 915-919 ◽  
Author(s):  
N. Kalivas ◽  
L. Costaridou ◽  
I. Kandarakis ◽  
D. Cavouras ◽  
C.D. Nomicos ◽  
...  
Keyword(s):  
Medical Imaging ◽  
Signal To Noise Ratio ◽  
Optical Gain ◽  
Transfer Efficiency ◽  
Signal To Noise ◽  
X Ray ◽  
Noise Ratio

Spatial resolution and signal-to-noise ratio in x-ray imaging

2019 ◽  
Author(s):  
Timur Gureyev ◽  
David M. Paganin ◽  
Alex Kozlov ◽  
Harry Quiney
Keyword(s):  
Spatial Resolution ◽  
Signal To Noise Ratio ◽  
Signal To Noise ◽  
X Ray ◽  
X Ray Imaging ◽  
Noise Ratio

Enhancing the Signal-to-Noise Ratio of X-ray Diffraction Profiles by Smoothed Principal Component Analysis

2005 ◽  
Vol 77 (20) ◽  
pp. 6563-6570 ◽  
Author(s):  
Zeng Ping Chen ◽  
Julian Morris ◽  
Elaine Martin ◽  
Robert B. Hammond ◽  
Xiaojun Lai ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Signal To Noise Ratio ◽  
Principal Component ◽  
Component Analysis ◽  
X Ray Diffraction ◽  
Signal To Noise ◽  
X Ray ◽  
Noise Ratio

Improving Signal-to-Noise Ratio in Scanning Transmission Electron Microscopy Energy-Dispersive X-Ray (STEM-EDX) Spectrum Images Using Single-Atomic-Column Cross-Correlation Averaging

2016 ◽  
Vol 22 (3) ◽  
pp. 536-543 ◽  
Author(s):  
Jong Seok Jeong ◽  
K. Andre Mkhoyan
Keyword(s):  
Cross Correlation ◽  
Signal To Noise Ratio ◽  
Energy Dispersive ◽  
Reference Image ◽  
Routine Practice ◽  
Signal To Noise ◽  
Atomic Column ◽  
X Ray ◽  
Noise Ratio ◽  
Reliable Solution

AbstractAcquiring an atomic-resolution compositional map of crystalline specimens has become routine practice, thus opening possibilities for extracting subatomic information from such maps. A key challenge for achieving subatomic precision is the improvement of signal-to-noise ratio (SNR) of compositional maps. Here, we report a simple and reliable solution for achieving high-SNR energy-dispersive X-ray (EDX) spectroscopy spectrum images for individual atomic columns. The method is based on standard cross-correlation aided by averaging of single-column EDX maps with modifications in the reference image. It produces EDX maps with minimal specimen drift, beam drift, and scan distortions. Step-by-step procedures to determine a self-consistent reference map with a discussion on the reliability, stability, and limitations of the method are presented here.

Effect of exposure and scattering on signal-to-noise ratio for improved defect sensitivity in X-ray radiography

2013 ◽  
Vol 55 (10) ◽  
pp. 548-552
Author(s):  
T Saravanan ◽  
K Arunmuthu ◽  
John Philip ◽  
B Purna Chandra Rao ◽  
T Jayakumar
Keyword(s):  
Signal To Noise Ratio ◽  
Signal To Noise ◽  
X Ray ◽  
Defect Sensitivity ◽  
Noise Ratio
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