scholarly journals Information Restitution in the Optical Memories using a Thin Layer of the Vanadium Dioxide

2018 ◽  
Vol 11 (5) ◽  
pp. 26-34 ◽  
Author(s):  
Mohammed Zouini ◽  
◽  
Abderrahim Ben Chaib ◽  
Abdesselam Mdaa ◽  
El Mehdi el Khattabi ◽  
...  
2015 ◽  
Vol 9 (1) ◽  
pp. 2303-2310
Author(s):  
Abderrahim Benchaib ◽  
Abdesselam Mdaa ◽  
Izeddine Zorkani ◽  
Anouar Jorio

The vanadium dioxide VO₂ currently became very motivating for the nanotechnologies’ researchers. It makes party of the intelligent materials because these optical properties abruptly change semiconductor state with metal at a critical  temperature θ = 68°C. This transition from reversible phase is carried out from a monoclinical structure characterizing its semiconductor state at low temperature towards the metal state of this material which becomes tétragonal rutile for  θ ˃ 68°C ; it is done during a few nanoseconds. Several studies were made on this material in a massive state and a thin layer. We will simulate by Maple the constant optics of a thin layer of VO₂ thickness z = 82 nm for the metal state according to the energy ω of the incidental photons in the energy interval: 0.001242 ≤ ω(ev) ≤ 6, from the infra-red (I.R) to the ultra-violet (U.V) so as to be able to control the various technological nano applications, like the detectors I.R or the U.V,  the intelligent windows to  increase  the energy efficiency in the buildings in order to save the cost of energy consumption by electric air-conditioning and the paintings containing nano crystals of this material. The constant optics, which we will simulate, is: the index of refraction, the reflectivity, the transmittivity, the coefficient of extinction, the dielectric functions ԑ₁ real part and  ԑ₂  imaginary part of the permittivity complexes ԑ of this material and the coefficient absorption. 


2015 ◽  
Vol 8 (2) ◽  
pp. 2148-2155 ◽  
Author(s):  
Abderrahim Benchaib ◽  
Abdesselam Mdaa ◽  
Izeddine Zorkani ◽  
Anouar Jorio

The vanadium dioxide is a material thermo chromium which sees its optical properties changing at the time of the transition from the phase of semiconductor state ↔ metal, at a critical temperature of 68°C. The study of the optical properties of a thin layer of VO₂ thickness 82 nm, such as the dielectric function, the index of refraction, the coefficient ofextinction, the absorption’s coefficient, the reflectivity, the transmittivity, in the photonic spectrum of energy ω located inthe interval: 0.001242 ≤ ω (ev) ≤ 6, enables us to control well its practical utility in various applications, like the intelligentpanes, the photovoltaic, paintings for increasing energy efficiency in buildings, detectors of infra-red (I.R) or ultra-violet(U.V). We will make simulations with Maple and compare our results with those of the literature


Author(s):  
Abderrahim Ben chaib ◽  
Zouini Mohammed ◽  
Izeddine Zorkani ◽  
Abdesselam Mdaa ◽  
Anouar Jorio
Keyword(s):  

Author(s):  
William J. Baxter

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.


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