DEVELOPMENT OF COMPACT AND FLEXIBLE QUADRATURE HYBRID COUPLER USING COAXIAL CABLE WITH CAPACITIVE LOADING FOR 1.5T INDIGENOUS MRI SYSTEM

In this paper, design and development of compact Rat- Race coupler is presented. The device is designed with commercially available semi rigid coaxial cable. The semi rigid coaxial is modified for desired impedance to suit the requirement of Rat- race hybrid coupler. The physical structure of the coupler is in rectangular form instead of the conventional ring form. With this structure, all the ports are available in line on the same side. This eases the integration of the device with other modules or devices in the system. The total area occupied the coupler is reduced drastically by meandering the transmission line. The shielded transmission line provides better port isolation and less radiation loss. Design, implementation and measured results are presented.

Download Full-text

Novel Compact Implementation of Rat-Race Hybrid Coupler Using Coaxial Cable For VHF Applications

2019 TEQIP III Sponsored International Conference on Microwave Integrated Circuits, Photonics and Wireless Networks (IMICPW) ◽

10.1109/imicpw.2019.8933215 ◽

2019 ◽

Cited By ~ 1

Author(s):

Makarand Kulkarni ◽

A. N. Cheeran ◽

K. P. Ray ◽

S. S. Kakatkar

Keyword(s):

Coaxial Cable ◽

Hybrid Coupler

Download Full-text

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

ISTFA 1999: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa1999p0039 ◽

1999 ◽

Author(s):

Kenneth Krieg ◽

Richard Qi ◽

Douglas Thomson ◽

Greg Bridges

Keyword(s):

High Resolution ◽

Integrated Circuits ◽

Real Time ◽

High Speed ◽

Time Signal ◽

Surface Imaging ◽

Atomic Force ◽

Submicron Structures ◽

High Resolution Images ◽

Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

Download Full-text